Electron Microprobe Analysis (Cambridge Monographs on Physics)

S. J. B. Reed

ISBN 10: 0521204666 / ISBN 13: 9780521204668

Edité par Cambridge University Press, Camridge, UK, 1975

A propos de cet article

5.5" by 8.5", 400 pp. Dark red cloth, title and emblem imprinted in cover, gilt title on spine only. covers clean, top corners bumped, no wear to edges, Binding weak at p. 65, where glossy photo section ends, but nothing is tender or loose. No internal markings , no names, very clean. DUST JACKET All edges a little wavy, no tears or chips. sun-aged spine, light soil on back panel. Bottom front flap corner clipped: TOP corner states USA price at $34.50. Back panel of Jacket lists series of Cambridge Monographs on Physics, in order of publication, ending with this title.

N° de réf. du vendeur 1214004

Détails bibliographiques

• Titre: Electron Microprobe Analysis (Cambridge Monographs on Physics)
• Éditeur: Cambridge University Press, Camridge, UK
• Date de parution: 1975
• Langue: anglais
• ISBN à 10 chiffres: 0521204666
• ISBN à 13 chiffres: 9780521204668
• Reliure: Hardcover
• Édition: 1st Edition
• État de l'article: Very Good +
• État de la jaquette: Very Good

A propos de ce titre

Présentation de l'éditeur

This 1993 book gives a comprehensive account of both experimental and theoretical aspects of electron microprobe analysis, and is an extensively updated version of the seminal first edition, published in 1975. The design and operation of the instrument, including the electron column and both wavelength- and energy-dispersive X-ray spectrometers, are covered in the first part of the book. Experimental procedures for qualitative and quantitative analysis, using both types of spectrometer, are then discussed. Matrix ('ZAF') corrections, as required for quantitative analysis, are treated in some detail from both theoretical and practical viewpoints. Special considerations applying to the analysis of 'light' elements (atomic number below 10) are covered in a separate chapter. The emphasis throughout is on a sound understanding of principles and the treatment is applicable equally to the electron microprobe in its 'classical' form and to scanning electron microscopes fitted with X-ray spectrometers.