On Line-testing for VLSI

. Ed(s): Nicolaidis, Michael; Zorian, Yervant; Pradhan, Dhiraj K.

ISBN 10: 1441950338 / ISBN 13: 9781441950338

Edité par Springer-Verlag New York Inc., 2010

Editor(s): Nicolaidis, Michael; Zorian, Yervant; Pradhan, Dhiraj K. Series: Frontiers in Electronic Testing. Num Pages: 164 pages, biography. BIC Classification: TJFC; UGC. Category: (P) Professional & Vocational. Dimension: 254 x 178 x 8. Weight in Grams: 385. . 2010. 1st ed. Softcover of orig. ed. 1998. Paperback. . . . . N° de réf. du vendeur V9781441950338

Synopsis :

Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs.
On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties.
On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.

Présentation de l'éditeur: Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs.
On-Line Testing for Vlsi contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent Ieee International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties.
On-Line Testing for Vlsi is an edited volume of original research comprising invited contributions by leading researchers.

Détails bibliographiques

Titre : On Line-testing for VLSI
Éditeur : Springer-Verlag New York Inc.
Date d'édition : 2010
Reliure : Couverture souple
Etat : New
Edition : Edition originale