Polarization Analysis and Applications to Device Technology, International Symposium on - Volume 2873, Proceedings of SPIE - The International Society for Optical Engineering, 12-14 June 1996, Yokohama, Japan

�diteur

The International Society for Optical Engineering, Bellingham, WA, U.S.A.

Date de parution

1996

Langue

anglais

ISBN � 10 chiffres

0819422711

ISBN � 13 chiffres

9780819422712

Reliure

Soft cover

�dition

1st Edition.

�tat de l'article

Very Good

�tat de la jaquette

No Jacket

Type de livre

Ex-Library

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