Testing of Digital Systems

Jha, N. K.; Gupta, S.

ISBN 10: 0521773563 / ISBN 13: 9780521773560

Edité par Cambridge University Press, 2003

A propos de cet article

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Détails bibliographiques

• Titre: Testing of Digital Systems
• Éditeur: Cambridge University Press
• Date de parution: 2003
• Langue: anglais
• ISBN à 10 chiffres: 0521773563
• ISBN à 13 chiffres: 9780521773560
• Reliure: Hardcover
• Édition: 1st Edition
• État de l'article: Very Good

A propos de ce titre

Synopsis

The most comprehensive and wide ranging book on the testing of semiconductor devices and systems.

À propos des auteurs

Niraj Jha is Professor of Electrical Engineering at Princeton University and head of the Center of Embedded System-on-a-Chip Design, where his current research is focussed on the synthesis and testing of these devices. He is a fellow of IEEE, associate editor of IEEE Transactions on VLSI Systems and The Journal of Electronic Testing: Theory and Applications (JETTA) and a recipient of the AT&T Foundation award and the NEC preceptorship award for research excellence.

Sandeep Gupta is an Associate Professor in the Department of Electrical Engineering at the University of Southern California, USA. He is Co-Director of the M.S. Program in VLSI Design, with research interests in the area of VLSI testing and design. He is a member of the IEEE.