VLSI Design and Test (Paperback)

Ambika Prasad Shah

ISBN 10: 3031215133 / ISBN 13: 9783031215131

Edité par Springer International Publishing AG, Cham, 2022

A propos de cet article

Paperback. This book constitutes the proceedings of the 26th International Symposium on VLSI Design and Test, VDAT 2022, which took place in Jammu, India, in July 2022.The 32 regular papers and 16 short papers presented in this volume were carefully reviewed and selected from 220 submissions. They were organized in topical sections as follows: Devices and Technology; Sensors; Analog/Mixed Signal; Digital Design; Emerging Technologies and Memory; System Design. This book constitutes the proceedings of the 26th International Symposium on VLSI Design and Test, VDAT 2022, which took place in Jammu, India, in July 2022.The 32 regular papers and 16 short papers presented in this volume were carefully reviewed and selected from 220 submissions. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.

N° de réf. du vendeur 9783031215131

Détails bibliographiques

• Titre: VLSI Design and Test (Paperback)
• Éditeur: Springer International Publishing AG, Cham
• Date de parution: 2022
• Langue: anglais
• ISBN à 10 chiffres: 3031215133
• ISBN à 13 chiffres: 9783031215131
• Reliure: Paperback
• Édition: Edition originale
• État de l'article: new

A propos de ce titre

Synopsis

This book constitutes the proceedings of the 26th International Symposium on VLSI Design and Test, VDAT 2022, which took place in Jammu, India, in July 2022.
The 32 regular papers and 16 short papers presented in this volume were carefully reviewed and selected from 220 submissions. They were organized in topical sections as follows: Devices and Technology; Sensors; Analog/Mixed Signal; Digital Design; Emerging Technologies and Memory; System Design.