High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test (Frontiers in Electronic Testing)

R. Dean Adams

ISBN 10: 1402072554 / ISBN 13: 9781402072550

Edité par Springer, 2002

A propos de cet article

SIGNED BY AUTHOR. Springer-Verlag New York Inc., United States, 2002. Hardcover. Condition: New. 2003 ed. Language: English. Seller Inventory # 0000019.

N° de réf. du vendeur 0000020

Détails bibliographiques

• Titre: High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test (Frontiers in Electronic Testing)
• Éditeur: Springer
• Date de parution: 2002
• Langue: anglais
• ISBN à 10 chiffres: 1402072554
• ISBN à 13 chiffres: 9781402072550
• Reliure: Hardcover
• État de l'article: New
• Signé: Signed by Author(s)

A propos de ce titre

Synopsis

Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully.
High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test.

High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.