Synopsis
Higher circuit densities, increasingly more complex application ohjectives, and advanced packaging technologies have suhstantially increased the need to incorporate defect-tolerance and fault-tolerance in the design of VLSI and WSI systems. The goals of defect-tolerance and fault-tolerance are yield enhancement and improved reliahility. The emphasis on this area has resulted in a new field of interdisciplinary scientific research. I n fact, advanced methods of defect/fault control and tolerance are resulting in enhanced manufacturahility and productivity of integrated circuit chips, VI.SI systems, and wafer scale integrated circuits. In 1987, Dr. W. Moore organized an "International Workshop on Designing for Yield" at Oxford University. Edited papers of that workshop were published in reference [II. The participants in that workshop agreed that meetings of this type should he con- tinued. preferahly on a yearly hasis. It was Dr. I. Koren who organized the "IEEE Inter national Workshop on Defect and Fault Tolerance in VLSI Systems" in Springfield Massachusetts the next year. Selected papers from that workshop were puhlished as the first volume of this series [21.
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Defect and Fault Tolerance in VLSI Systems Volume 2.
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Plenum Press, New York, 1990
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Defect and Fault Tolerance in VLSI Systems: Volume 2 (Defect & Fault Tolerance in VLSI Systems)
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Defect and Fault Tolerance in VLSI Systems: Volume 2 (Defect & Fault Tolerance in VLSI Systems)
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Defect and Fault Tolerance in VLSI Systems
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Springer US Okt 1990, 1990
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ISBN 13 : 9780306435317
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Buch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Higher circuit densities, increasingly more complex application ohjectives, and advanced packaging technologies have suhstantially increased the need to incorporate defect-tolerance and fault-tolerance in the design of VLSI and WSI systems. The goals of defect-tolerance and fault-tolerance are yield enhancement and improved reliahility. The emphasis on this area has resulted in a new field of interdisciplinary scientific research. I n fact, advanced methods of defect/fault control and tolerance are resulting in enhanced manufacturahility and productivity of integrated circuit chips, VI.SI systems, and wafer scale integrated circuits. In 1987, Dr. W. Moore organized an 'International Workshop on Designing for Yield' at Oxford University. Edited papers of that workshop were published in reference [II. The participants in that workshop agreed that meetings of this type should he con tinued. preferahly on a yearly hasis. It was Dr. I. Koren who organized the 'IEEE Inter national Workshop on Defect and Fault Tolerance in VLSI Systems' in Springfield Massachusetts the next year. Selected papers from that workshop were puhlished as the first volume of this series [21. 334 pp. Englisch. N° de réf. du vendeur 9780306435317
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Defect and Fault Tolerance in VLSI Systems
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Gebunden. Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Higher circuit densities, increasingly more complex application ohjectives, and advanced packaging technologies have suhstantially increased the need to incorporate defect-tolerance and fault-tolerance in the design of VLSI and WSI systems. The goals of def. N° de réf. du vendeur 5901694
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Defect and Fault Tolerance in VLSI Systems | Volume 2
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Buch. Etat : Neu. Defect and Fault Tolerance in VLSI Systems | Volume 2 | C. H. Stapper (u. a.) | Buch | xiii | Englisch | 1990 | Springer US | EAN 9780306435317 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu Print on Demand. N° de réf. du vendeur 102424840
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Defect and Fault Tolerance in VLSI Systems
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Defect and Fault Tolerance in VLSI Systems
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Springer US, Springer US Okt 1990, 1990
ISBN 10 : 0306435314
ISBN 13 : 9780306435317
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Buch. Etat : Neu. This item is printed on demand - Print on Demand Titel. Neuware -Higher circuit densities, increasingly more complex application ohjectives, and advanced packaging technologies have suhstantially increased the need to incorporate defect-tolerance and fault-tolerance in the design of VLSI and WSI systems. The goals of defect-tolerance and fault-tolerance are yield enhancement and improved reliahility. The emphasis on this area has resulted in a new field of interdisciplinary scientific research. I n fact, advanced methods of defect/fault control and tolerance are resulting in enhanced manufacturahility and productivity of integrated circuit chips, VI.SI systems, and wafer scale integrated circuits. In 1987, Dr. W. Moore organized an 'International Workshop on Designing for Yield' at Oxford University. Edited papers of that workshop were published in reference [II. The participants in that workshop agreed that meetings of this type should he con tinued. preferahly on a yearly hasis. It was Dr. I. Koren who organized the 'IEEE Inter national Workshop on Defect and Fault Tolerance in VLSI Systems' in Springfield Massachusetts the next year. Selected papers from that workshop were puhlished as the first volume of this series [21.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 334 pp. Englisch. N° de réf. du vendeur 9780306435317
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Defect and Fault Tolerance in VLSI Systems : Volume 2
Edité par
Springer US, Springer US, 1990
ISBN 10 : 0306435314
ISBN 13 : 9780306435317
Neuf
Couverture rigide
Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne
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Buch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - Higher circuit densities, increasingly more complex application ohjectives, and advanced packaging technologies have suhstantially increased the need to incorporate defect-tolerance and fault-tolerance in the design of VLSI and WSI systems. The goals of defect-tolerance and fault-tolerance are yield enhancement and improved reliahility. The emphasis on this area has resulted in a new field of interdisciplinary scientific research. I n fact, advanced methods of defect/fault control and tolerance are resulting in enhanced manufacturahility and productivity of integrated circuit chips, VI.SI systems, and wafer scale integrated circuits. In 1987, Dr. W. Moore organized an 'International Workshop on Designing for Yield' at Oxford University. Edited papers of that workshop were published in reference [II. The participants in that workshop agreed that meetings of this type should he con tinued. preferahly on a yearly hasis. It was Dr. I. Koren who organized the 'IEEE Inter national Workshop on Defect and Fault Tolerance in VLSI Systems' in Springfield Massachusetts the next year. Selected papers from that workshop were puhlished as the first volume of this series [21. N° de réf. du vendeur 9780306435317
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Defect and Fault Tolerance in VLSI Systems
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Etat : New. Print on Demand pp. 336 52:B&W 6.14 x 9.21in or 234 x 156mm (Royal 8vo) Case Laminate on White w/Gloss Lam. N° de réf. du vendeur 7358071
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