Electron Energy-Loss Spectroscopy in the Electron Microscope - Couverture rigide

Egerton, R. F.

 
9780306452239: Electron Energy-Loss Spectroscopy in the Electron Microscope

Synopsis

The Second Edition explores several new applications of EELS developed during the last ten years. The chapters include recent progress in parallel-recording detectors and image-filtering systems as well as spectral fine structure. This edition also features updated computer programs which will perform spectrum deconvolution and compute partial ionization cross-sections.

Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.

Autres éditions populaires du même titre