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Synopsis
Failure Analysis of Integrated Circuits: Tools and Techniques provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. These include applications specific to performing failure analysis such as decapsulation, deprocessing, and fail site isolation, as well as physical and chemical analysis tools and techniques. The coverage is qualitative, and it provides a general understanding for making intelligent tool choices. Also included is coverage of the shortcomings, limitations, and strengths of each technique.
Failure Analysis of Integrated Circuits: Tools and Techniques is a `must have' reference work for semiconductor professionals and researchers.
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Failure Analysis of Integrated Circuits : Tools and Techniques
Edité par
Springer, 1999
ISBN 10 : 0412145618
ISBN 13 : 9780412145612
Ancien ou d'occasion
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Vendeur : Mahler Books, PFLUGERVILLE, TX, Etats-Unis
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Hardcover. Etat : Very Good. This book is in very good condition; no remainder marks. It does have some cover shelfwear. Some scraping inside front cover from removal of a stubborn book plate. Inside pages are clean. ; The Springer International Series In Engineering And Computer Science, 494; 268 pages. N° de réf. du vendeur 01GW23-679-257
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Failure Analysis of Integrated Circuits: Tools and Techniques (The Springer International Series in Engineering and Computer Science, 494)
Edité par
Springer, 1999
ISBN 10 : 0412145618
ISBN 13 : 9780412145612
Ancien ou d'occasion
Couverture rigide
Vendeur : SecondSale, Montgomery, IL, Etats-Unis
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Etat : Very Good. Item in very good condition! Textbooks may not include supplemental items i.e. CDs, access codes etc. N° de réf. du vendeur 00082498580
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Failure Analysis of Integrated Circuits: Tools and Techniques (The Springer International Series in Engineering and Computer Science, 494)
Edité par
Springer, 1999
ISBN 10 : 0412145618
ISBN 13 : 9780412145612
Ancien ou d'occasion
Couverture rigide
Vendeur : The Book Bin, Salem, OR, Etats-Unis
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Hardcover. Etat : As New. Binding firm, interior clean and unmarked. A nice copy. N° de réf. du vendeur CORV-BBC-OK91350
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Failure Analysis of Integrated Circuits
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Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This must have reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical fa. N° de réf. du vendeur 5914199
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Failure Analysis of Integrated Circuits: Tools and Techniques (The Springer International Series in Engineering and Computer Science, 494)
Vendeur : Toscana Books, AUSTIN, TX, Etats-Unis
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Hardcover. Etat : new. Excellent Condition.Excels in customer satisfaction, prompt replies, and quality checks. N° de réf. du vendeur Scanned0412145618
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Failure Analysis of Integrated Circuits: Tools and Techniques (The Springer International Series in Engineering and Computer Science, 494)
Vendeur : BennettBooksLtd, North Las Vegas, NV, Etats-Unis
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hardcover. Etat : New. In shrink wrap. Looks like an interesting title! N° de réf. du vendeur Q-0412145618
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Failure Analysis of Integrated Circuits
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Springer US Jan 1999, 1999
ISBN 10 : 0412145618
ISBN 13 : 9780412145612
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Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne
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Buch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This 'must have' reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. 276 pp. Englisch. N° de réf. du vendeur 9780412145612
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Failure Analysis of Integrated Circuits: Tools and Techniques (The Springer International Series in Engineering and Computer Science, 494)
Vendeur : Ria Christie Collections, Uxbridge, Royaume-Uni
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Etat : New. In. N° de réf. du vendeur ria9780412145612_new
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Failure Analysis of Integrated Circuits
Edité par
Springer US, Springer New York Jan 1999, 1999
ISBN 10 : 0412145618
ISBN 13 : 9780412145612
Neuf
Couverture rigide
Vendeur : buchversandmimpf2000, Emtmannsberg, BAYE, Allemagne
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Buch. Etat : Neu. Neuware -Failure Analysis of Integrated Circuits: Tools and Techniques provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. These include applications specific to performing failure analysis such as decapsulation, deprocessing, and fail site isolation, as well as physical and chemical analysis tools and techniques. The coverage is qualitative, and it provides a general understanding for making intelligent tool choices. Also included is coverage of the shortcomings, limitations, and strengths of each technique.Failure Analysis of Integrated Circuits: Tools and Techniques is a `must have' reference work for semiconductor professionals and researchers.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 276 pp. Englisch. N° de réf. du vendeur 9780412145612
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Failure Analysis of Integrated Circuits : Tools and Techniques
Edité par
Springer US, Springer New York, 1999
ISBN 10 : 0412145618
ISBN 13 : 9780412145612
Neuf
Couverture rigide
Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne
Évaluation du vendeur 5 sur 5 étoiles
Buch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - Failure Analysis of Integrated Circuits: Tools and Techniques provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. These include applications specific to performing failure analysis such as decapsulation, deprocessing, and fail site isolation, as well as physical and chemical analysis tools and techniques. The coverage is qualitative, and it provides a general understanding for making intelligent tool choices. Also included is coverage of the shortcomings, limitations, and strengths of each technique. Failure Analysis of Integrated Circuits: Tools and Techniques is a `must have' reference work for semiconductor professionals and researchers. N° de réf. du vendeur 9780412145612
Quantité disponible : 1 disponible(s)