Articles liés à From Contamination to Defects, Faults and Yield Loss:...
From Contamination to Defects, Faults and Yield Loss: Simulation and Applications - Couverture rigide
Synopsis
Over the years there has been a large increase in the functionality available on a single integrated circuit. This has been mainly achieved by a continuous drive towards smaller feature sizes, larger dies, and better packing efficiency. However, this greater functionality has also resulted in substantial increases in the capital investment needed to build fabrication facilities. Given such a high level of investment, it is critical for IC manufacturers to reduce manufacturing costs and get a better return on their investment. The most obvious method of reducing the manufacturing cost per die is to improve manufacturing yield.
Modern VLSI research and engineering (which includes design manufacturing and testing) encompasses a very broad range of disciplines such as chemistry, physics, material science, circuit design, mathematics and computer science. Due to this diversity, the VLSI arena has become fractured into a number of separate sub-domains with little or no interaction between them. This is the case with the relationships between testing and manufacturing.
From Contamination to Defects, Faults and Yield Loss: Simulation and Applications focuses on the core of the interface between manufacturing and testing, i.e., the contamination-defect-fault relationship. The understanding of this relationship can lead to better solutions of many manufacturing and testing problems.
Failure mechanism models are developed and presented which can be used to accurately estimate probability of different failures for a given IC. This information is critical in solving key yield-related applications such as failure analysis, fault modeling and design manufacturing.
Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.
Acheter neuf
Afficher cet article
EUR 74,10
Gratuit expédition vers Etats-Unis
Destinations, frais et délaisAutres éditions populaires du même titre
Résultats de recherche pour From Contamination to Defects, Faults and Yield Loss:...
Image d'archives
From Contamination to Defects, Faults and Yield Loss: Simulation and Applications (Frontiers in Electronic Testing)
Edité par
Kluwer, 1996
ISBN 10 : 0792397142
ISBN 13 : 9780792397144
Ancien ou d'occasion
Couverture rigide
Vendeur : Zubal-Books, Since 1961, Cleveland, OH, Etats-Unis
Évaluation du vendeur 5 sur 5 étoiles
Etat : Good. 150 pp., Hardcover, ex library else text clean and binding tight. - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country. N° de réf. du vendeur ZB1126563
Quantité disponible : 1 disponible(s)
Image d'archives
From Contamination To Defects, Faults And Yield Loss
Vendeur : Romtrade Corp., STERLING HEIGHTS, MI, Etats-Unis
Évaluation du vendeur 5 sur 5 étoiles
Etat : New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide. N° de réf. du vendeur ABNR-156760
Quantité disponible : 1 disponible(s)
Image d'archives
From Contamination To Defects, Faults And Yield Loss
Vendeur : Basi6 International, Irving, TX, Etats-Unis
Évaluation du vendeur 5 sur 5 étoiles
Etat : Brand New. New. US edition. Excellent Customer Service. N° de réf. du vendeur ABEOCT25-118563
Quantité disponible : 1 disponible(s)
Image d'archives
From Contamination to Defects, Faults and Yield Loss: Simulation and Applications (Frontiers in Electronic Testing, 5)
Vendeur : ALLBOOKS1, Direk, SA, Australie
Évaluation du vendeur 5 sur 5 étoiles
Brand new book. Fast ship. Please provide full street address as we are not able to ship to P O box address. N° de réf. du vendeur SHAK118563
Quantité disponible : 1 disponible(s)
Image d'archives
From Contamination to Defects, Faults and Yield Loss: Simulation and Applications (Frontiers in Electronic Testing, 5)
Vendeur : BennettBooksLtd, San Diego, NV, Etats-Unis
Évaluation du vendeur 5 sur 5 étoiles
hardcover. Etat : New. In shrink wrap. Looks like an interesting title! N° de réf. du vendeur Q-0792397142
Quantité disponible : 1 disponible(s)
Image fournie par le vendeur
From Contamination to Defects, Faults and Yield Loss : Simulation and Applications
Vendeur : GreatBookPrices, Columbia, MD, Etats-Unis
Évaluation du vendeur 5 sur 5 étoiles
Etat : New. N° de réf. du vendeur 758098-n
Quantité disponible : Plus de 20 disponibles
Image d'archives
From Contamination to Defects, Faults and Yield Loss (Hardcover)
Edité par
Kluwer Academic Publishers, Dordrecht, 1996
ISBN 10 : 0792397142
ISBN 13 : 9780792397144
Neuf
Couverture rigide
Vendeur : Grand Eagle Retail, Bensenville, IL, Etats-Unis
Évaluation du vendeur 5 sur 5 étoiles
Hardcover. Etat : new. Hardcover. Over the years there has been a large increase in the functionality available on a single integrated circuit. This has been mainly achieved by a continuous drive towards smaller feature sizes, larger dies and better packing efficiency. However, this greater functionality has also resulted in substantial increases in the capital investment needed to build fabrication facilities. Given such a high level of investment, it is critical for IC manufacturers to reduce manufacturing costs and get a better return on their investment. The most obvious method of reducing the manufacturing cost per die is to improve manufacturing yield. Modern VLSI research and engineering (which includes design manufacturing and testing) encompasses a very broad range of disciplines such as chemistry, physics, material science, circuit design, mathematics and computer science. Due to this diversity, the VLSI arena has become fractured into a number of separate sub-domains with little or no interaction between them. This is the case with the relationships between testing and manufacturing.This volume focuses on the core of the interface between manufacturing and testing - the contamination-defect-fault relationship. The understanding of this relationship can lead to better solutions of many manufacturing and testing problems. Failure mechanism models are developed and presented which can be used to accurately estimate the probability of different failures for a given IC. This information is critical in solving key yield-related applications such as failure analysis, fault modelling and design manufacturing. Given such a high level of investment, it is critical for IC manufacturers to reduce manufacturing costs and get a better return on their investment. The most obvious method of reducing the manufacturing cost per die is to improve manufacturing yield. Shipping may be from multiple locations in the US or from the UK, depending on stock availability. N° de réf. du vendeur 9780792397144
Quantité disponible : 1 disponible(s)
Image fournie par le vendeur
From Contamination to Defects, Faults and Yield Loss : Simulation and Applications
Edité par
Springer, 1996
ISBN 10 : 0792397142
ISBN 13 : 9780792397144
Ancien ou d'occasion
Couverture rigide
Vendeur : GreatBookPrices, Columbia, MD, Etats-Unis
Évaluation du vendeur 5 sur 5 étoiles
Etat : As New. Unread book in perfect condition. N° de réf. du vendeur 758098
Quantité disponible : Plus de 20 disponibles
Image d'archives
From Contamination to Defects, Faults and Yield Loss : Simulation and Applications
Edité par
Springer US, 1996
ISBN 10 : 0792397142
ISBN 13 : 9780792397144
Ancien ou d'occasion
Couverture rigide
Vendeur : Buchpark, Trebbin, Allemagne
Évaluation du vendeur 5 sur 5 étoiles
Etat : Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher. N° de réf. du vendeur 3022620/202
Quantité disponible : 2 disponible(s)
Image d'archives
From Contamination to Defects, Faults and Yield Loss: Simulation and Applications (Frontiers in Electronic Testing, 5)
Vendeur : Ria Christie Collections, Uxbridge, Royaume-Uni
Évaluation du vendeur 5 sur 5 étoiles
Etat : New. In. N° de réf. du vendeur ria9780792397144_new
Quantité disponible : Plus de 20 disponibles