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Synopsis
MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test and diagnosis are major obstacles to their use. Multi-Chip Module Test Strategies presents state-of-the-art test strategies for MCMs. This volume of original research is designed for engineers interested in practical implementations of MCM test solutions and for designers looking for leading edge test and design-for-testability solutions for their next designs.
Multi-Chip Module Test Strategies consists of eight contributions by leading researchers. It is designed to provide a comprehensive and well-balanced coverage of the MCM test domain.
Multi-Chip Module Test Strategies has also been published as a special issue of the Journal of Electronic Testing: Theory and Applications (JETTA, Volume 10, Numbers 1 and 2).
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- ÉditeurSpringer
- Date d'édition1997
- ISBN 10 079239920X
- ISBN 13 9780792399209
- ReliureRelié
- Langueanglais
- Numéro d'édition1
- Nombre de pages167
- ÉditeurZorian Yervant
- Coordonnées du fabricantnon disponible
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Multi-Chip Module Test Strategies
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Springer US, 1997
ISBN 10 : 079239920X
ISBN 13 : 9780792399209
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Gebunden. Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test and diagnosis are major obstacles to their use. Multi-Chip Module Test . N° de réf. du vendeur 5971820
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Multi-Chip Module Test Strategies
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Buch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test and diagnosis are major obstacles to their use. Multi-Chip Module Test Strategies presents state-of-the-art test strategies for MCMs. This volume of original research is designed for engineers interested in practical implementations of MCM test solutions and for designers looking for leading edge test and design-for-testability solutions for their next designs. Multi-Chip Module Test Strategies consists of eight contributions by leading researchers. It is designed to provide a comprehensive and well-balanced coverage of the MCM test domain. Multi-Chip Module Test Strategies has also been published as a special issue of the Journal of Electronic Testing: Theory and Applications (JETTA, Volume 10, Numbers 1 and 2). 168 pp. Englisch. N° de réf. du vendeur 9780792399209
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Multi-Chip Module Test Strategies
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Springer US, Springer New York Mai 1997, 1997
ISBN 10 : 079239920X
ISBN 13 : 9780792399209
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Buch. Etat : Neu. Neuware -MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test and diagnosis are major obstacles to their use. Multi-Chip Module Test Strategies presents state-of-the-art test strategies for MCMs. This volume of original research is designed for engineers interested in practical implementations of MCM test solutions and for designers looking for leading edge test and design-for-testability solutions for their next designs.Multi-Chip Module Test Strategies consists of eight contributions by leading researchers. It is designed to provide a comprehensive and well-balanced coverage of the MCM test domain.Multi-Chip Module Test Strategies has also been published as a special issue of the Journal of Electronic Testing: Theory and Applications (JETTA, Volume 10, Numbers 1 and 2). 168 pp. Englisch. N° de réf. du vendeur 9780792399209
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Multi-Chip Module Test Strategies (Frontiers in Electronic Testing, 7)
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Springer US, Springer New York, 1997
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ISBN 13 : 9780792399209
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Buch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test and diagnosis are major obstacles to their use. Multi-Chip Module Test Strategies presents state-of-the-art test strategies for MCMs. This volume of original research is designed for engineers interested in practical implementations of MCM test solutions and for designers looking for leading edge test and design-for-testability solutions for their next designs. Multi-Chip Module Test Strategies consists of eight contributions by leading researchers. It is designed to provide a comprehensive and well-balanced coverage of the MCM test domain. Multi-Chip Module Test Strategies has also been published as a special issue of the Journal of Electronic Testing: Theory and Applications (JETTA, Volume 10, Numbers 1 and 2). N° de réf. du vendeur 9780792399209
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Multi-Chip Module Test Strategies
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Multi-Chip Module Test Strategies (Frontiers in Electronic Testing)
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Multi-Chip Module Test Strategies (Frontiers in Electronic Testing, 7)
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Multi-Chip Module Test Strategies (Frontiers in Electronic Testing)
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Springer, 1997
ISBN 10 : 079239920X
ISBN 13 : 9780792399209
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