MOS Interface Physics, Process and Characterization - Couverture rigide

Wang, Shengkai; Wang, Xiaolei

Couverture rigide

ISBN 10 : 1032106271 ISBN 13 : 9781032106274

Editeur : CRC Press, 2021

Synopsis

The electronic device based on Metal Oxide Semiconductor (MOS) structure is the most important component of a large-scale integrated circuit and the key to achieving high performance devices. This book contains experimental examples focusing on MOS and will be a reference for academics and postgraduates in the field of microelectronics.

A propos du livre

À propos de l?auteur

Shengkai Wang is a professor in the Institute of Microelectronics, Chinese Academy of Sciences. He received Ph.D. from the University of Tokyo in 2011 and has been engaged in Ge, III-V, SiC in MOS technology. He has published more than 100 papers and authorized 40+ patents.

Xiaolei Wang is a professor in the Institute of Microelectronics, Chinese Academy of Sciences. He received Ph.D. from the Institute of Microelectronics, Chinese Academy of Sciences in 2013 and has been engaged in Si/Ge based MOS technology. He has published more than 100 papers.

Détails de l'édition

• Éditeur: CRC Press
• Date d'édition: 2021
• Langue: anglais
• ISBN 10: 1032106271
• ISBN 13: 9781032106274
• Reliure: Relié
• Nombre de pages: 174
• Coordonnées du fabricant: non disponible
• Personne responsable: non disponible