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9781461377986: Multi-Chip Module Test Strategies

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ISBN 10 : 1461377986 ISBN 13 : 9781461377986

Editeur : Springer, 2012

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MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test and diagnosis are major obstacles to their use. Multi-Chip Module Test Strategies presents state-of-the-art test strategies for MCMs. This volume of original research is designed for engineers interested in practical implementations of MCM test solutions and for designers looking for leading edge test and design-for-testability solutions for their next designs.
Multi-Chip Module Test Strategies consists of eight contributions by leading researchers. It is designed to provide a comprehensive and well-balanced coverage of the MCM test domain.
Multi-Chip Module Test Strategies has also been published as a special issue of the Journal of Electronic Testing: Theory and Applications (JETTA, Volume 10, Numbers 1 and 2).

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�diteurSpringer
Date d'�dition2012
ISBN 10 1461377986
ISBN 13 9781461377986
ReliureBroch�
Langueanglais
Nombre de pages168
�diteurZorian Yervant
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9780792399209: Multi-Chip Module Test Strategies

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ISBN 10 : 079239920X ISBN 13 : 9780792399209
Editeur : Springer, 1997
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Multi-Chip Module Test Strategies

Zorian, Yervant

Edit� par Springer US, 2012

ISBN 10 : 1461377986 ISBN 13 : 9781461377986

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Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test and diagnosis are major obstacles to their use. Multi-Chip Module Test . N� de r�f. du vendeur 4195917

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Multi-Chip Module Test Strategies

Yervant Zorian

Edit� par Springer US Okt 2012, 2012

ISBN 10 : 1461377986 ISBN 13 : 9781461377986

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Taschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test and diagnosis are major obstacles to their use. Multi-Chip Module Test Strategies presents state-of-the-art test strategies for MCMs. This volume of original research is designed for engineers interested in practical implementations of MCM test solutions and for designers looking for leading edge test and design-for-testability solutions for their next designs. Multi-Chip Module Test Strategies consists of eight contributions by leading researchers. It is designed to provide a comprehensive and well-balanced coverage of the MCM test domain. Multi-Chip Module Test Strategies has also been published as a special issue of the Journal of Electronic Testing: Theory and Applications (JETTA, Volume 10, Numbers 1 and 2). 168 pp. Englisch. N� de r�f. du vendeur 9781461377986

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Multi-Chip Module Test Strategies

Yervant Zorian

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ISBN 10 : 1461377986 ISBN 13 : 9781461377986

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Taschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test and diagnosis are major obstacles to their use. Multi-Chip Module Test Strategies presents state-of-the-art test strategies for MCMs. This volume of original research is designed for engineers interested in practical implementations of MCM test solutions and for designers looking for leading edge test and design-for-testability solutions for their next designs. Multi-Chip Module Test Strategies consists of eight contributions by leading researchers. It is designed to provide a comprehensive and well-balanced coverage of the MCM test domain. Multi-Chip Module Test Strategies has also been published as a special issue of the Journal of Electronic Testing: Theory and Applications (JETTA, Volume 10, Numbers 1 and 2). N� de r�f. du vendeur 9781461377986

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Multi-Chip Module Test Strategies

Yervant Zorian

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ISBN 10 : 1461377986 ISBN 13 : 9781461377986

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Taschenbuch. Etat : Neu. This item is printed on demand - Print on Demand Titel. Neuware -MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test and diagnosis are major obstacles to their use. Multi-Chip Module Test Strategies presents state-of-the-art test strategies for MCMs. This volume of original research is designed for engineers interested in practical implementations of MCM test solutions and for designers looking for leading edge test and design-for-testability solutions for their next designs.Multi-Chip Module Test Strategies consists of eight contributions by leading researchers. It is designed to provide a comprehensive and well-balanced coverage of the MCM test domain.Multi-Chip Module Test Strategies has also been published as a special issue of the Journal of Electronic Testing: Theory and Applications (JETTA, Volume 10, Numbers 1 and 2).Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 168 pp. Englisch. N� de r�f. du vendeur 9781461377986

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