High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test - Couverture souple
Livre 12 sur 36: Frontiers in Electronic Testing
Synopsis
Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully.
High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test.
High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.
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Taschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Are memory applications more critical than they have been in the past Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested. 264 pp. Englisch. N° de réf. du vendeur 9781475784749
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Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were. N° de réf. du vendeur 4208178
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Taschenbuch. Etat : Neu. High Performance Memory Testing | Design Principles, Fault Modeling and Self-Test | R. Dean Adams | Taschenbuch | xiv | Englisch | 2013 | Springer | EAN 9781475784749 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. N° de réf. du vendeur 105639479
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High Performance Memory Testing
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Taschenbuch. Etat : Neu. This item is printed on demand - Print on Demand Titel. Neuware -Are memory applications more critical than they have been in the past Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully.High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test.High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 264 pp. Englisch. N° de réf. du vendeur 9781475784749
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High Performance Memory Testing : Design Principles, Fault Modeling and Self-Test
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Springer US, Springer New York, 2013
ISBN 10 : 1475784740
ISBN 13 : 9781475784749
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Taschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - Are memory applications more critical than they have been in the past Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested. N° de réf. du vendeur 9781475784749
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High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test (Frontiers in Electronic Testing (22A))
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ISBN 13 : 9781475784749
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