Articles liés à Trace-Based Post-Silicon Validation for VLSI Circuits
Synopsis
This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits. The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and cost-effective. A series of automatic tracing solutions and innovative design for debug (DfD) techniques are described, including techniques for trace signal selection for enhancing visibility of functional errors, a multiplexed signal tracing strategy for improving functional error detection, a tracing solution for debugging electrical errors, an interconnection fabric for increasing data bandwidth and supporting multi-core debug, an interconnection fabric design and optimization technique to increase transfer flexibility and a DfD design and associated tracing solution for improving debug efficiency and expanding tracing window. The solutions presented in this book improve the validation quality of VLSI circuits, and ultimately enable the design and fabrication of reliable electronic devices.
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Présentation de l'éditeur
This book surveys state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits, discusses key challenges in post-silicon validation and offers automated solutions that are systematic and cost-effective.
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Trace-Based Post-Silicon Validation for VLSI Circuits
Edité par
Springer International Publishing, 2016
ISBN 10 : 3319375946
ISBN 13 : 9783319375946
Neuf
Couverture souple
Vendeur : moluna, Greven, Allemagne
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Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides a comprehensive summary of state-of-the-art on post-silicon validationOffers automated solutions that are systematic and cost-effective for post-silicon validation, from trace signal selection to trace data transferIllustrate key c. N° de réf. du vendeur 458605054
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Trace-Based Post-Silicon Validation for VLSI Circuits (Lecture Notes in Electrical Engineering, 252)
Vendeur : thebookforest.com, San Rafael, CA, Etats-Unis
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paperback. Etat : New. Well packaged and promptly shipped from California. US veteran operated. N° de réf. du vendeur 1LAGBP000ZNZ
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Trace-Based Post-Silicon Validation for VLSI Circuits
Edité par
Berlin Springer International Publishing Springer Aug 2016, 2016
ISBN 10 : 3319375946
ISBN 13 : 9783319375946
Neuf
Taschenbuch
Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne
Évaluation du vendeur 5 sur 5 étoiles
Taschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits. The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and cost-effective. A series of automatic tracing solutions and innovative design for debug (DfD) techniques are described, including techniques for trace signal selection for enhancing visibility of functional errors, a multiplexed signal tracing strategy for improving functional error detection, a tracing solution for debugging electrical errors, an interconnection fabric for increasing data bandwidth and supporting multi-core debug, an interconnection fabric design and optimization technique to increase transfer flexibility and a DfD design and associated tracing solution for improving debug efficiency and expanding tracing window. The solutions presented in this book improve the validation quality of VLSI circuits, and ultimately enable the design and fabrication of reliable electronic devices. 108 pp. Englisch. N° de réf. du vendeur 9783319375946
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Trace-Based Post-Silicon Validation for VLSI Circuits (Lecture Notes in Electrical Engineering, 252)
Vendeur : Ria Christie Collections, Uxbridge, Royaume-Uni
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Etat : New. In. N° de réf. du vendeur ria9783319375946_new
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Trace-Based Post-Silicon Validation for VLSI Circuits
Edité par
Springer, Berlin, Springer International Publishing, Springer, 2016
ISBN 10 : 3319375946
ISBN 13 : 9783319375946
Neuf
Taschenbuch
Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne
Évaluation du vendeur 5 sur 5 étoiles
Taschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits. The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and cost-effective. A series of automatic tracing solutions and innovative design for debug (DfD) techniques are described, including techniques for trace signal selection for enhancing visibility of functional errors, a multiplexed signal tracing strategy for improving functional error detection, a tracing solution for debugging electrical errors, an interconnection fabric for increasing data bandwidth and supporting multi-core debug, an interconnection fabric design and optimization technique to increase transfer flexibility and a DfD design and associated tracing solution for improving debug efficiency and expanding tracing window. The solutions presented in this book improve the validation quality of VLSI circuits, and ultimately enable the design and fabrication of reliable electronic devices. N° de réf. du vendeur 9783319375946
Quantité disponible : 2 disponible(s)
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Trace-Based Post-Silicon Validation for VLSI Circuits (Lecture Notes in Electrical Engineering (252))
Vendeur : Books Puddle, New York, NY, Etats-Unis
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Etat : New. pp. 123. N° de réf. du vendeur 26378182616
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Trace-Based Post-Silicon Validation for VLSI Circuits (Lecture Notes in Electrical Engineering (252))
impression à la demandeVendeur : Majestic Books, Hounslow, Royaume-Uni
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Etat : New. Print on Demand pp. 123. N° de réf. du vendeur 385688583
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Trace-Based Post-Silicon Validation for VLSI Circuits (Lecture Notes in Electrical Engineering (252))
impression à la demandeVendeur : Biblios, Frankfurt am main, HESSE, Allemagne
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Etat : New. PRINT ON DEMAND pp. 123. N° de réf. du vendeur 18378182610
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Trace-based Post-silicon Validation for Vlsi Circuits
Vendeur : Revaluation Books, Exeter, Royaume-Uni
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Paperback. Etat : Brand New. reprint edition. 124 pages. 9.25x6.10x0.30 inches. In Stock. N° de réf. du vendeur x-3319375946
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Trace-Based Post-Silicon Validation for VLSI Circuits (Lecture Notes in Electrical Engineering, 252)
Vendeur : Lucky's Textbooks, Dallas, TX, Etats-Unis
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Etat : New. N° de réf. du vendeur ABLIING23Mar3113020095955
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