Pattern Recognition with Support Vector Machines: First International Workshop, SVM 2002, Niagara Falls, Canada, August 10, 2002. Proceedings - Couverture souple

Verri, Alessandro; Lee, Seong-Whan

 
9783540440161: Pattern Recognition with Support Vector Machines: First International Workshop, SVM 2002, Niagara Falls, Canada, August 10, 2002. Proceedings
Couverture souple
ISBN 10 : 354044016X ISBN 13 : 9783540440161
Editeur : Springer, 2008

Synopsis

With their introduction in 1995, Support Vector Machines (SVMs) marked the beginningofanewerainthelearningfromexamplesparadigm.Rootedinthe Statistical Learning Theory developed by Vladimir Vapnik at AT&T, SVMs quickly gained attention from the pattern recognition community due to a n- beroftheoreticalandcomputationalmerits.Theseinclude, forexample, the simple geometrical interpretation of the margin, uniqueness of the solution, s- tistical robustness of the loss function, modularity of the kernel function, and over't control through the choice of a single regularization parameter. Like all really good and far reaching ideas, SVMs raised a number of - terestingproblemsforboththeoreticiansandpractitioners.Newapproachesto Statistical Learning Theory are under development and new and more e?cient methods for computing SVM with a large number of examples are being studied. Being interested in the development of trainable systems ourselves, we decided to organize an international workshop as a satellite event of the 16th Inter- tional Conference on Pattern Recognition emphasizing the practical impact and relevance of SVMs for pattern recognition. By March 2002, a total of 57 full papers had been submitted from 21 co- tries.Toensurethehighqualityofworkshopandproceedings, theprogramc- mitteeselectedandaccepted30ofthemafterathoroughreviewprocess.Ofthese papers16werepresentedin4oralsessionsand14inapostersession.Thepapers span a variety of topics in pattern recognition with SVMs from computational theoriestotheirimplementations.Inadditiontotheseexcellentpresentations, there were two invited papers by Sayan Mukherjee, MIT and Yoshua Bengio, University of Montreal.

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Éditeur
Springer
Date d'édition
2008
Langue
anglais
ISBN 10 
354044016X
ISBN 13 
9783540440161
Reliure
Broché
Nombre de pages
440
Coordonnées du fabricant
non disponible
Personne responsable
CMN Printpool Inh. Mathis Neumann
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