Transmission Electron Microscopy and Diffractometry of Materials - Couverture rigide

Howe, James M.; Fultz, Brent

 
9783540678410: Transmission Electron Microscopy and Diffractometry of Materials
Couverture rigide
ISBN 10 : 3540678417 ISBN 13 : 9783540678410
Editeur : Springer-Verlag Berlin and Heidelberg GmbH & Co. K, 2001

Synopsis

This book teaches graduate students the concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. It emphasizes themes common to both techniques, such as wave coherence, scattering from atoms, and the formation and analysis of diffraction patterns. It also describes unique aspects of each technique, especially spectroscopy, conventional imaging, and high-resolution imaging in the TEM. The textbook thoroughly develops both introductory and advanced-level material, using over 400 accompanying illustrations. Both practical and theoretical issues are explained in detail. The book can be used as an introductory-level or an advanced-level graduate text since sections/chapters are sorted according to difficulty and grouped for use in quarter and semester courses on TEM and XRD. The appendix provides a set of introductory TEM laboratory exercises, and contains up-to-date reference data for both TEM and XRD.

Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.

Éditeur
Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Date d'édition
2001
Langue
anglais
ISBN 10 
3540678417
ISBN 13 
9783540678410
Reliure
Relié
Nombre de pages
767
Coordonnées du fabricant
non disponible
Personne responsable
CMN Printpool Inh. Mathis Neumann
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