Transmission Electron Microscopy: Physics of Image Formation and Microanalysis - Couverture souple

Reimer, Ludwig

Couverture souple

ISBN 10 : 3662215802 ISBN 13 : 9783662215807

Editeur : Springer, 2014

Synopsis

The aim of this book is to present the theory of image and contrast formation and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematical and dynamical theories of electron diffraction and their applications for crystal structure determination and imaging of lattice defects. X-ray microanalysis and energy-loss spectroscopy are treated as analytical methods. The second edition includes discussion of recent progress, especially in the areas of energy-loss spectroscopy, crystal-lattice imaging and reflection electron microscopy.

Détails de l'édition

• Éditeur: Springer
• Date d'édition: 2014
• Langue: anglais
• ISBN 10: 3662215802
• ISBN 13: 9783662215807
• Reliure: Tapa blanda
• Nombre de pages: 568
• Éditeur: Hawkes P.W.
• Coordonnées du fabricant: non disponible
• Personne responsable: CMN Printpool Inh. Mathis Neumann; https://www.also.com/ec/cms5/en_6000/6000/index.jsp; ; Friedrich-Karl-Str. 9; Hamburg; Allemagne