Optical Testing of Semiconductor Devices under High Energy Pulses: Advanced Optical Interferometric Methods for Nanosecond Mapping of Semiconductor Devices under High Energy Pulses - Couverture souple

Dubec, Viktor

 
9783838104041: Optical Testing of Semiconductor Devices under High Energy Pulses: Advanced Optical Interferometric Methods for Nanosecond Mapping of Semiconductor Devices under High Energy Pulses
Couverture souple
ISBN 10 : 3838104048 ISBN 13 : 9783838104041
Editeur : Suedwestdeutscher Verlag fuer Hochschulschriften, 2009

Synopsis

For optimisation of devices and verification of device simulation models the knowledge of heat dissipation and of free carrier concentration in the device is essential. Non-destructive optical methods based on monitoring of the refractive index, absorption or light emission have previously been developed for investigation of transient temperature or free carrier changes. However, these methods suffer either from small spatial or time resolution. Therefore two testing techniques based on transient interferometric mapping have been developed within this thesis: a two-dimensional multiple-time-instant single-shot technique and a two-beam technique with sub-nanosecond time resolution.

Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.

Présentation de l'éditeur

For optimisation of devices and verification of device simulation models the knowledge of heat dissipation and of free carrier concentration in the device is essential. Non-destructive optical methods based on monitoring of the refractive index, absorption or light emission have previously been developed for investigation of transient temperature or free carrier changes. However, these methods suffer either from small spatial or time resolution. Therefore two testing techniques based on transient interferometric mapping have been developed within this thesis: a two-dimensional multiple-time-instant single-shot technique and a two-beam technique with sub-nanosecond time resolution.

Biographie de l'auteur

Viktor Dubec was born in 1977 in Bratislava, Slovakia. He received his Mag. degree in year 2000 at the Department of Optics and Optoelectronics, Comenius University Bratislava. In 2001 he joined the group for investigation of ESD protection devices at the Institute for Solid State Electronics, Vienna University of Technology, Austria.

Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.

Éditeur
Suedwestdeutscher Verlag fuer Hochschulschriften
Date d'édition
2009
Langue
anglais
ISBN 10 
3838104048
ISBN 13 
9783838104041
Reliure
Broché
Nombre de pages
160
Coordonnées du fabricant
non disponible
Personne responsable
non disponible