In this thesis leakage reduction techniques like stack forcing, multiple threshold CMOS, variable threshold CMOS are explored, that mitigate leakage in circuits, operating in the active mode at various temperatures. Also, implications of technology scaling on the choice of techniques to mitigate total leakage are closely examined. The result is guidelines for designing low-leakage circuits in nanometer technology nodes. Logic gates in the 180nm, 130nm, 100nm and 70nm technology nodes are simulated and analyzed. Here delay analysis of various logic circuits are also examined.
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In this thesis leakage reduction techniques like stack forcing, multiple threshold CMOS, variable threshold CMOS are explored, that mitigate leakage in circuits, operating in the active mode at various temperatures. Also, implications of technology scaling on the choice of techniques to mitigate total leakage are closely examined. The result is guidelines for designing low-leakage circuits in nanometer technology nodes. Logic gates in the 180nm, 130nm, 100nm and 70nm technology nodes are simulated and analyzed. Here delay analysis of various logic circuits are also examined.
I have received M.Tech. in VLSI Design from NIT Hamirpur (H.P.) and B.Tech. in Electronics & Communication Engineering from UPTU Lucknow (U.P.). Now i am doing lot of research work on low power VLSI field.
Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.
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Taschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -In this thesis leakage reduction techniques like stack forcing, multiple threshold CMOS, variable threshold CMOS are explored, that mitigate leakage in circuits, operating in the active mode at various temperatures. Also, implications of technology scaling on the choice of techniques to mitigate total leakage are closely examined. The result is guidelines for designing low-leakage circuits in nanometer technology nodes. Logic gates in the 180nm, 130nm, 100nm and 70nm technology nodes are simulated and analyzed. Here delay analysis of various logic circuits are also examined. 100 pp. Englisch. N° de réf. du vendeur 9783844382778
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Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Sharma VijayI have received M.Tech. in VLSI Design from NIT Hamirpur (H.P.) and B.Tech. in Electronics & Communication Engineering from UPTU Lucknow (U.P.). Now i am doing lot of research work on low power VLSI field.In this th. N° de réf. du vendeur 5475804
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Taschenbuch. Etat : Neu. This item is printed on demand - Print on Demand Titel. Neuware -In this thesis leakage reduction techniques like stack forcing, multiple threshold CMOS, variable threshold CMOS are explored, that mitigate leakage in circuits, operating in the active mode at various temperatures. Also, implications of technology scaling on the choice of techniques to mitigate total leakage are closely examined. The result is guidelines for designing low-leakage circuits in nanometer technology nodes. Logic gates in the 180nm, 130nm, 100nm and 70nm technology nodes are simulated and analyzed. Here delay analysis of various logic circuits are also examined.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 100 pp. Englisch. N° de réf. du vendeur 9783844382778
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Taschenbuch. Etat : Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - In this thesis leakage reduction techniques like stack forcing, multiple threshold CMOS, variable threshold CMOS are explored, that mitigate leakage in circuits, operating in the active mode at various temperatures. Also, implications of technology scaling on the choice of techniques to mitigate total leakage are closely examined. The result is guidelines for designing low-leakage circuits in nanometer technology nodes. Logic gates in the 180nm, 130nm, 100nm and 70nm technology nodes are simulated and analyzed. Here delay analysis of various logic circuits are also examined. N° de réf. du vendeur 9783844382778
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Taschenbuch. Etat : Neu. CMOS Low Power Analysis | Scaling effect & Power Delay Analysis | Vijay Sharma | Taschenbuch | 100 S. | Englisch | 2011 | LAP LAMBERT Academic Publishing | EAN 9783844382778 | Verantwortliche Person für die EU: BoD - Books on Demand, In de Tarpen 42, 22848 Norderstedt, info[at]bod[dot]de | Anbieter: preigu Print on Demand. N° de réf. du vendeur 106955457
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