Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices - Couverture rigide

Nakamura, Takashi; Ibe, Eishi; Baba, Mamoru; Yahagi, Yasuo; Kameyama, Hideaki

 
9789812778819: Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices
Couverture rigide
ISBN 10 : 9812778810 ISBN 13 : 9789812778819
Editeur : World Scientific Publishing Co Pte Ltd, 2008

Synopsis

Terrestrial neutron-induced soft errors in semiconductor memory devices are currently a major concern in reliability issues. Understanding the mechanism and quantifying soft-error rates are primarily crucial for the design and quality assurance of semiconductor memory devices. This book covers the relevant up-to-date topics in terrestrial neutron-induced soft errors, and aims to provide succinct knowledge on neutron-induced soft errors to the readers by presenting several valuable and unique features.

Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.

Présentation de l'éditeur

Terrestrial neutron-induced soft errors in semiconductor memory devices are currently a major concern in reliability issues. Understanding the mechanism and quantifying soft-error rates are primarily crucial for the design and quality assurance of semiconductor memory devices. This book covers the relevant up-to-date topics in terrestrial neutron-induced soft errors, and aims to provide succinct knowledge on neutron-induced soft errors to the readers by presenting several valuable and unique features.

Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.

Éditeur
World Scientific Publishing Co Pte Ltd
Date d'édition
2008
Langue
anglais
ISBN 10 
9812778810
ISBN 13 
9789812778819
Reliure
Relié
Nombre de pages
368
Coordonnées du fabricant
non disponible
Personne responsable
non disponible