Titre: CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test (Frontiers in Electronic Testing, 40)
�diteur: Springer
Date de parution: 2010
Langue: anglais
ISBN � 10 chiffres: 904817855X
ISBN � 13 chiffres: 9789048178551
Reliure: Couverture souple
�tat de l'article: New

A propos de ce titre

Synopsis

This book covers a broad range of topics related to SRAM design and testing. It includes everything from SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing.

� propos de l?auteur

Prof. Sachdev has authored several successful books with Springer

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