Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing (34))

Sachdev, Manoj, Pineda de Gyvez, José

ISBN 10: 0387465464 / ISBN 13: 9780387465463

Edité par Springer, 2007

A propos de cet article

Like New.

N° de réf. du vendeur ERICA78703874654646

Détails bibliographiques

• Titre: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing (34))
• Éditeur: Springer
• Date de parution: 2007
• Langue: anglais
• ISBN à 10 chiffres: 0387465464
• ISBN à 13 chiffres: 9780387465463
• Reliure: Hardcover
• Édition: 2ème Édition
• État de l'article: Like New
• Type de livre: book

A propos de ce titre

Synopsis

This book is essential to understand new test methodologies, algorithms and industrial practices. Without its insight into the physics of nano-metric technologies, it would be difficult to develop system-level test strategies that yield a high IC fault coverage. The work on defect-oriented testing presented in the book is not final, and it is an evolving field with interesting challenges imposed by the ever-changing nature of nano-metric technologies. The 2nd edition of Defect Oriented Testing has been extensively updated with the addition of chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering to provide a link between defect sources and yield. Test and design practitioners from academia and industry will find that Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits lays the foundations for further pioneering work.