Digital Systems Testing and Testable Design (Electrical Engineering, Communications, and Signal Processin)

Miron; Breuer, Melvin A.; Friedman, Arthur D. Abramovici

ISBN 10: 0716781794 / ISBN 13: 9780716781790

Edité par Computer Science Press, 1990

A propos de cet article

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Détails bibliographiques

• Titre: Digital Systems Testing and Testable Design (Electrical Engineering, Communications, and Signal Processin)
• Éditeur: Computer Science Press
• Date de parution: 1990
• Langue: anglais
• ISBN à 10 chiffres: 0716781794
• ISBN à 13 chiffres: 9780716781790
• Reliure: hardcover
• État de l'article: Acceptable

A propos de ce titre

Synopsis

For many years, Breuer-Friedman's Diagnosis and Reliable Design ofDigital Systems was the most widely used textbook in digital system testing and testable design. Now, Computer Science Press makes available a new and greativ expanded edition. Incorporating a significant amount of new material related to recently developed technologies, the new edition offers comprehensive and state-ofthe-art treatment of both testing and testable design.

Quatrième de couverture

This widely–used textbook provides comprehensive, state–of–the–art coverage of digital systems testing and testable design.

Considered a definitive text in this area, the book includes in–depth discussions of the following topics:

Test generation
Fault modeling for classic and new technologies
Simulation
Fault simulation
Design for testability
Built–in self–test Diagnosis

All topics are covered extensively, from fundamental concepts to advanced techniques.

Successfully used world–wide at leading universities, the book is appropriate for graduate–level and senior–level undergraduate courses. Numerous examples and problems help make the learning process easier for the reader. Test engineers, ASIC and system designers, and CAD developers will find it an invaluable tool to keep current with recent changes in the field.