Failure Analysis: High Technology Devices (De Gruyter STEM)

Sullivan, Daniel J. D.; Carleton, Eric J.

ISBN 10: 150152478X ISBN 13: 9781501524783

Edit� par De Gruyter, 2022

Langue: anglais

Etat : Neuf Couverture souple

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D�tails bibliographiques

Titre

Failure Analysis: High Technology Devices (De Gruyter STEM)

�diteur

De Gruyter

Date de parution

2022

Langue

anglais

ISBN � 10 chiffres

150152478X

ISBN � 13 chiffres

9781501524783

Reliure

Couverture souple

�tat de l'article

New

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A propos de ce titre

Synopsis

The book presents a unique view of failure analysis of high technology devices. It describes capabilities and limitations of many analytical techniques and testing paths and decisions best followed in example failure analysis studies.

� propos de l?auteur

Dr. Daniel J. D. Sullivan

attended Cal & U. C. San Diego. Managed: FA, Reliability and Materials labs. Currently in sales and marketing at EAG labs. He has also written a non-technical book, "Don't Date Crazy" by DJDS, and published a board game called Infection.

Dr. Eric J. Carleton

is a technology developer and consultant who has incubated multiple technology startups, founded Arrhenius, a failure analysis firm, and serves clients in a wide array of industries on scientific analysis and litigation matters.

Les informations fournies dans la section � A propos du livre � peuvent faire r�f�rence � une autre �dition de ce titre.

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