High-resolution x-ray scattering. From thin films and multilayers.

Holy, Vaclav; Pietsch, Ullrich; Baumbach, Tilo

ISBN 10: 354062029X / ISBN 13: 9783540620297

Edité par Berlin, Springer, 1999

A propos de cet article

Ex-library with stamp and library-signature. GOOD condition, some traces of use. C-02760 9783540620297 Sprache: Englisch Gewicht in Gramm: 1050.

N° de réf. du vendeur 2488639

Détails bibliographiques

• Titre: High-resolution x-ray scattering. From thin films and multilayers.
• Éditeur: Berlin, Springer
• Date de parution: 1999
• Langue: anglais
• ISBN à 10 chiffres: 354062029X
• ISBN à 13 chiffres: 9783540620297
• Reliure: Hardcover
• Poids: 1050 grammes
• Catalogues du vendeur:
  • SA MATHEMATIK

A propos de ce titre

Synopsis

This critical overview presents experimental methods for solving most frequent structural problems of mono-crystalline thin films and layered systems, including thickness, crystalline state, strain distribution, interface quality and other properties. A unified theoretical approach based on kinematical and dynamical scattering theories describes the experimental methods. This book is intended as a reference for experimentalists who want to improve their knowledge on modern X-ray methods for thin film analysis.