Power-Aware Testing and Test Strategies for Low Power Devices

Patrick Girard

ISBN 10: 1489983139 / ISBN 13: 9781489983138

Edité par Springer US Sep 2014, 2014

A propos de cet article

This item is printed on demand - it takes 3-4 days longer - Neuware -Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices. 388 pp. Englisch.

N° de réf. du vendeur 9781489983138

Détails bibliographiques

• Titre: Power-Aware Testing and Test Strategies for Low Power Devices
• Éditeur: Springer US Sep 2014
• Date de parution: 2014
• Langue: anglais
• ISBN à 10 chiffres: 1489983139
• ISBN à 13 chiffres: 9781489983138
• Reliure: Taschenbuch
• État de l'article: Neu

A propos de ce titre

Synopsis

Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices.