"Introduces a theory of random testing in digital circuits for the first time and offers practical guidance for the implementation of random pattern generators, signature analyzers design for random testability, and testing results. Contains several new and unpublished results. "

� propos de l?auteur:

Rene David is a Research Director at the Centre National de la recherche Scientififique working at the Instuit National Polytechnique de Grenoble, France.

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Articles li�s � Random Testing of Digital Circuits : Theory & Applicatio...

Random Testing of Digital Circuits : Theory & Application

David, Rene

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