Transmission Electron Microscopy and Diffractometry of Materials [Englisch] [Gebundene Ausgabe] Brent Fultz (Autor), James Howe (Autor) This hugely successful and highly acclaimed text is designed to meet the needs of materials scientists at all levels. In this third edition readers get a fully updated and revised text, too. Fultz and Howe explain concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM, and all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been add

Brent Fultz (Autor), James Howe (Autor)

ISBN 10: 3540738851 ISBN 13: 9783540738855
Edité par Springer Auflage: 3rd ed. 2008. Corr. 2nd printing 2009, 2008
Langue: anglais
Etat : Occasion - Assez bon Couverture rigide

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Ancien(s) ou d'occasion - Couverture rigide

Etat : Occasion - Assez bon

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