Transmission Electron Microscopy and Diffractometry of Materials

Fultz B Fultz Brent

ISBN 10: 3540678417 / ISBN 13: 9783540678410

Edité par Springer, 2001

A propos de cet article

pp. 748.

N° de réf. du vendeur 94834924

Détails bibliographiques

• Titre: Transmission Electron Microscopy and Diffractometry of Materials
• Éditeur: Springer
• Date de parution: 2001
• Langue: anglais
• ISBN à 10 chiffres: 3540678417
• ISBN à 13 chiffres: 9783540678410
• Reliure: Couverture rigide
• État de l'article: New

A propos de ce titre

Synopsis

This book teaches graduate students the concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. It emphasizes themes common to both techniques, such as wave coherence, scattering from atoms, and the formation and analysis of diffraction patterns. It also describes unique aspects of each technique, especially spectroscopy, conventional imaging, and high-resolution imaging in the TEM. The textbook thoroughly develops both introductory and advanced-level material, using over 400 accompanying illustrations. Both practical and theoretical issues are explained in detail. The book can be used as an introductory-level or an advanced-level graduate text since sections/chapters are sorted according to difficulty and grouped for use in quarter and semester courses on TEM and XRD. The appendix provides a set of introductory TEM laboratory exercises, and contains up-to-date reference data for both TEM and XRD.