100% BRAND NEW US HARDCOVER STUDENT 3rd Edition / shrink wrapped / Mint condition / ISBN-10: 3540738851 / Shipped out in one business day with free tracking.

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D�tails bibliographiques

Titre

Transmission Electron Microscopy and Diffractometry of Materials

�diteur

Springer

Date de parution

2009

Langue

anglais

ISBN � 10 chiffres

3540738851

ISBN � 13 chiffres

9783540738855

Reliure

Hardcover

�dition

3rd Edition.

�tat de l'article

New

Catalogues du vendeur

A propos de ce titre

Synopsis

This hugely successful and highly acclaimed text is designed to meet the needs of materials scientists at all levels. In this third edition readers get a fully updated and revised text, too. Fultz and Howe explain concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM, and all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.

Les informations fournies dans la section � A propos du livre � peuvent faire r�f�rence � une autre �dition de ce titre.

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