VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))

Wang, Laung-Terng; Wu, Cheng-Wen; Wen, Xiaoqing

ISBN 10: 0123705975 / ISBN 13: 9780123705976

Edité par Morgan Kaufmann, 2006

A propos de cet article

In shrink wrap. Looks like an interesting title!

N° de réf. du vendeur Q-0123705975

Détails bibliographiques

• Titre: VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))
• Éditeur: Morgan Kaufmann
• Date de parution: 2006
• Langue: anglais
• ISBN à 10 chiffres: 0123705975
• ISBN à 13 chiffres: 9780123705976
• Reliure: hardcover
• État de l'article: New

A propos de ce titre

Synopsis

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.

À propos des auteurs

Laung-Terng Wang, Ph.D., is founder, chairman, and chief executive officer of SynTest Technologies, CA. He received his EE Ph.D. degree from Stanford University. A Fellow of the IEEE, he holds 18 U.S. Patents and 12 European Patents, and has co-authored/co-edited two internationally used DFT textbooks- VLSI Test Principles and Architectures (2006) and System-on-Chip Test Architectures (2007).

Kwang-Ting (Tim) Cheng, Ph.D., is a Professor and Chair of the Electrical and Computer Engineering Department at the University of California, Berkeley. A Fellow of the IEEE, he has published over 300 technical papers, co-authored three books, and holds 11 U.S. Patents.