VERY GOOD Unmarked PAGES And COVER And BINDING. Softback, AS SHOWN. Published/printed by North-Holland. 1988 printing. Approximately 6 X 9. 539 pages.

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D�tails bibliographiques

Titre

Ellipsometry and Polarized Light (North-Holland Personal Library)

�diteur

North Holland, Amsterdam

Date de parution

1988

Langue

anglais

ISBN � 10 chiffres

0444870164

ISBN � 13 chiffres

9780444870162

Reliure

Soft cover

�dition

1st Edition

�tat de l'article

Very Good

Catalogues du vendeur

Science, especially Physics snd Math.

A propos de ce titre

Synopsis

Ellipsometry is a unique optical technique of great sensitivity for in situ non-destructive characterization of surface (inter-facial) phenomena (reactions) utilizing the change in the state of polarization of a light-wave probe. Although known for almost a century, the use of ellipsometry has increased rapidly in the last two decades. Among the most significant recent developments are new applications, novel and automated instrumentation and techniques for error-free data analysis. This book provides the necessary analytical and experimental tools needed for competent understanding and use of these developments. It is directed to those who are already working in the field and, more importantly, to the newcomer who would otherwise have to sift through several hundred published papers. The authors first present a comprehensive study of the different mathematical representations of polarized light and how such light is processed by optical systems, going on to show how these tools are applied to the analysis of ellipsometer systems. To relate ellipsometric measurements to surface properties, use is then made of electromagnetic theory.

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