Principles of Semiconductor Network Testing

Afshar, Amir

ISBN 10: 0750694726 / ISBN 13: 9780750694728

Edité par Newnes, 1995

A propos de cet article

First Edition, First Printing. Published by Butterworth-Heinemann, 1995. Octavo. Book is like new. 30 day money back guarantee. NEXT DAY SHIPPING! Excellent customer service. Please email with any questions or if you would like a photo. All books packed carefully and ship with free delivery confirmation/tracking. All books come with free bookmarks. Ships from Sag Harbor, New York.

N° de réf. du vendeur 178901

Détails bibliographiques

• Titre: Principles of Semiconductor Network Testing
• Éditeur: Newnes
• Date de parution: 1995
• Langue: anglais
• ISBN à 10 chiffres: 0750694726
• ISBN à 13 chiffres: 9780750694728
• Reliure: Hardcover
• Édition: First Edition.
• État de l'article: Like New
• Catalogues du vendeur:
  • Science & Nature

A propos de ce titre

Synopsis

Principles of Semiconductor Network Testing gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor. This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources.

Présentation de l'éditeur

Principles of Semiconductor Network Testing gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor.

This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources.

• Introduces a novel component-testing philosophy for semiconductor test, product and design engineers
• Best new source of information for experienced semiconductor engineers as well as entry-level personnel
• Eight chapters about semiconductor testing