gilfrich john v goldsmith c huang ting (37 résultats)

Etat : Good. 756 pp., hardcover, ex library, else text and binding clean and tight, lacks dust jacket. - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country.

Etat : Very Good. 813 pp., hardcover, minor library markings else text clean & binding tight (lacks dust jacket). - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country.

Etat : New. SUPER FAST SHIPPING.

Etat : New.

Paperback. Etat : new. Paperback. The 41st Annual Conference on Applications of X-Ray Analysis was held August 2-6, 1993, at the Sheraton Denver Technical Center Hotel, Denver, Colorado. From its modest beginnings in the early 1950's, the Denver X-Ray Conference has grown to become a major venue in the national scientific calendar, with an ever-growing overseas participation. The 1993 Conference was the latest of these annual gatherings of x-ray analysts, who come together to discuss topics of current interest in diffraction and fluorescence. As the size and flavor of the Conference has changed over the years, so too have the methods and techniques of x-ray materials analysis matured. Science is advanced by the creativity of a few and the mistakes of many. It is important, therefore, that from time to time we sit back and reflect on how we got where we are, and where we are likely to go next. There has been no greater impact on the field than the introduction of the digital computer, and the Plenary Session of the 1993 Conference, "Impact of the PC in X-Ray Analysis," was designed to reflect on the role of the personal computer in the metamorphosis of x-ray instrumentation and techniques. Since the personal computer is a creation of non-x-ray specialists, we, as a group, have simply attached ourselves to the coat-tails of experts and developers in the PC field and taken advantage of new computer systems as and when they were developed. The 41st Annual Conference on Applications of X-Ray Analysis was held August 2-6, 1993, at the Sheraton Denver Technical Center Hotel, Denver, Colorado. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.

Etat : New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

Etat : Brand New. New. US edition. Excellent Customer Service.

Hardcover. Etat : new. Excellent Condition.Excels in customer satisfaction, prompt replies, and quality checks.

Etat : New. In.

Etat : New.

Etat : As New. Unread book in perfect condition.

Brand new book. Fast ship. Please provide full street address as we are not able to ship to P O box address.

Etat : New. pp. 784.

Etat : New. pp. 778 1st Edition.

Etat : New. SUPER FAST SHIPPING.

Etat : New. pp. 778.

Etat : New. pp. 778.

Etat : New. In.

Taschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - The 41st Annual Conference on Applications of X-Ray Analysis was held August 2-6, 1993, at the Sheraton Denver Technical Center Hotel, Denver, Colorado. From its modest beginnings in the early 1950's, the Denver X-Ray Conference has grown to become a major venue in the national scientific calendar, with an ever-growing overseas participation. The 1993 Conference was the latest of these annual gatherings of x-ray analysts, who come together to discuss topics of current interest in diffraction and fluorescence. As the size and flavor of the Conference has changed over the years, so too have the methods and techniques of x-ray materials analysis matured. Science is advanced by the creativity of a few and the mistakes of many. It is important, therefore, that from time to time we sit back and reflect on how we got where we are, and where we are likely to go next. There has been no greater impact on the field than the introduction of the digital computer, and the Plenary Session of the 1993 Conference, 'Impact of the PC in X-Ray Analysis,' was designed to reflect on the role of the personal computer in the metamorphosis of x-ray instrumentation and techniques. Since the personal computer is a creation of non-x-ray specialists, we, as a group, have simply attached ourselves to the coat-tails of experts and developers in the PC field and taken advantage of new computer systems as and when they were developed.

Gebunden. Etat : New. 89 articles organized under the following section heads: Impact of Computers on Xray Analysis. Applications of Whole Pattern Fitting: Structure Determination, Phase Identification, Lattice Parameters. Search/Match Methods, Phase Identification. Diffraction .

Paperback. Etat : new. Paperback. The 41st Annual Conference on Applications of X-Ray Analysis was held August 2-6, 1993, at the Sheraton Denver Technical Center Hotel, Denver, Colorado. From its modest beginnings in the early 1950's, the Denver X-Ray Conference has grown to become a major venue in the national scientific calendar, with an ever-growing overseas participation. The 1993 Conference was the latest of these annual gatherings of x-ray analysts, who come together to discuss topics of current interest in diffraction and fluorescence. As the size and flavor of the Conference has changed over the years, so too have the methods and techniques of x-ray materials analysis matured. Science is advanced by the creativity of a few and the mistakes of many. It is important, therefore, that from time to time we sit back and reflect on how we got where we are, and where we are likely to go next. There has been no greater impact on the field than the introduction of the digital computer, and the Plenary Session of the 1993 Conference, "Impact of the PC in X-Ray Analysis," was designed to reflect on the role of the personal computer in the metamorphosis of x-ray instrumentation and techniques. Since the personal computer is a creation of non-x-ray specialists, we, as a group, have simply attached ourselves to the coat-tails of experts and developers in the PC field and taken advantage of new computer systems as and when they were developed. The 41st Annual Conference on Applications of X-Ray Analysis was held August 2-6, 1993, at the Sheraton Denver Technical Center Hotel, Denver, Colorado. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.

Hardcover. Etat : Brand New. 784 pages. 10.25x7.00x1.75 inches. In Stock.

Buch. Etat : Neu. Neuware - 89 articles organized under the following section heads: Impact of Computers on Xray Analysis. Applications of Whole Pattern Fitting: Structure Determination, Phase Identification, Lattice Parameters. Search/Match Methods, Phase Identification. Diffraction from Single Crystals and Epitaxial Films. Xray Characterization of Films and Surface Layers. Strain and Stress Determination, Xray Fractography, Diffraction Peak Broadening Analysis. Advances in Detectors and Counting Electronics. XRD Techniques and Instrumentation, Nonambient Applications, Texture, other Applications. Xray Optics, Monochromators and Synthetic Multilayers. Total Reflection XRF Applications and Instrumentation, other XRF Techniques and Instrumentation. Mathematical Techniques in Xray Spectrometry. Geological and other Applications of XRS. Index.

Etat : New. In.

Hardcover. Etat : new. Hardcover. The 43rd Annual Conference on Applications ofX-ray Analysis was held August 1-5, 1994, at the Sheraton Steamboat Resort & Conference Center in Steamboat Springs, Colorado. The Denver X-Ray Conference has evolved from the 1950's into an international forum for the interaction of scientists, engineers and technologists interested in the use of x-rays in materials characterization. It has not only acted as a venue but has both stimulated and nurtured many of the principal developments in this field over the years. The major changes that have been occurring on the national and international scene as a result of the end of the cold war have dramatic-ally affected the way the materials community does business. The removal of defense priorities and development funds from most new materials initiatives has stimulated the char acterization communities to look to increasing the speed of their methods. This is being accom plished via the development of very fast dynamic characterization procedures which can rapidly and intelligently monitor and optimize the formation of a desired microstructure. The develop ment of intelligent characterization procedures applied in real-time during the manufacturing process can lead to the ability to design desired microstructures. Another potential advantage to this approach is its ability to characterize the actual amount of material which goes into a final product; permitting a rapid transition from R&D to manufacturing by avoiding the prob lems associated with scale-up. The 43rd Annual Conference on Applications ofX-ray Analysis was held August 1-5, 1994, at the Sheraton Steamboat Resort & Conference Center in Steamboat Springs, Colorado. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.

Etat : New.

Etat : As New. Unread book in perfect condition.

Gebunden. Etat : New. The 43rd Annual Conference on Applications ofX-ray Analysis was held August 1-5, 1994, at the Sheraton Steamboat Resort & Conference Center in Steamboat Springs, Colorado. The Denver X-Ray Conference has evolved from the 1950 s into an international forum f.

Hardcover. Etat : Brand New. 787 pages. 10.25x7.00x1.75 inches. In Stock.

Buch. Etat : Neu. Neuware - The 43rd Annual Conference on Applications ofX-ray Analysis was held August 1-5, 1994, at the Sheraton Steamboat Resort & Conference Center in Steamboat Springs, Colorado. The Denver X-Ray Conference has evolved from the 1950's into an international forum for the interaction of scientists, engineers and technologists interested in the use of x-rays in materials characterization. It has not only acted as a venue but has both stimulated and nurtured many of the principal developments in this field over the years. The major changes that have been occurring on the national and international scene as a result of the end of the cold war have dramatic-ally affected the way the materials community does business. The removal of defense priorities and development funds from most new materials initiatives has stimulated the char acterization communities to look to increasing the speed of their methods. This is being accom plished via the development of very fast dynamic characterization procedures which can rapidly and intelligently monitor and optimize the formation of a desired microstructure. The develop ment of intelligent characterization procedures applied in real-time during the manufacturing process can lead to the ability to design desired microstructures. Another potential advantage to this approach is its ability to characterize the actual amount of material which goes into a final product; permitting a rapid transition from R&D to manufacturing by avoiding the prob lems associated with scale-up.