Vendeur : GreatBookPrices, Columbia, MD, Etats-Unis
EUR 122,42
Quantité disponible : 15 disponible(s)
Ajouter au panierEtat : New.
Vendeur : GreatBookPrices, Columbia, MD, Etats-Unis
EUR 123,76
Quantité disponible : 15 disponible(s)
Ajouter au panierEtat : As New. Unread book in perfect condition.
Vendeur : Ria Christie Collections, Uxbridge, Royaume-Uni
EUR 116,48
Quantité disponible : Plus de 20 disponibles
Ajouter au panierEtat : New. In.
Vendeur : Ria Christie Collections, Uxbridge, Royaume-Uni
EUR 116,48
Quantité disponible : Plus de 20 disponibles
Ajouter au panierEtat : New. In.
Vendeur : GreatBookPricesUK, Woodford Green, Royaume-Uni
EUR 116,47
Quantité disponible : Plus de 20 disponibles
Ajouter au panierEtat : New.
Vendeur : GreatBookPrices, Columbia, MD, Etats-Unis
EUR 131,40
Quantité disponible : 15 disponible(s)
Ajouter au panierEtat : As New. Unread book in perfect condition.
Vendeur : GreatBookPrices, Columbia, MD, Etats-Unis
EUR 131,99
Quantité disponible : Plus de 20 disponibles
Ajouter au panierEtat : New.
Vendeur : GreatBookPrices, Columbia, MD, Etats-Unis
EUR 131,99
Quantité disponible : 15 disponible(s)
Ajouter au panierEtat : New.
Vendeur : Books Puddle, New York, NY, Etats-Unis
EUR 143,18
Quantité disponible : 4 disponible(s)
Ajouter au panierEtat : New. pp. 132.
Vendeur : BennettBooksLtd, Los Angeles, CA, Etats-Unis
EUR 143,33
Quantité disponible : 1 disponible(s)
Ajouter au panierhardcover. Etat : New. In shrink wrap. Looks like an interesting title!
Vendeur : Books Puddle, New York, NY, Etats-Unis
EUR 146,04
Quantité disponible : 4 disponible(s)
Ajouter au panierEtat : New. pp. ix + 140.
Vendeur : Revaluation Books, Exeter, Royaume-Uni
EUR 163,19
Quantité disponible : 1 disponible(s)
Ajouter au panierPaperback. Etat : Brand New. 141 pages. 9.00x6.00x0.36 inches. In Stock.
Langue: anglais
Edité par Springer US, Springer US, 1999
ISBN 10 : 0792385918 ISBN 13 : 9780792385912
Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne
EUR 112,77
Quantité disponible : 1 disponible(s)
Ajouter au panierBuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - Advances in the semiconductor technology have enabled steady, exponential im provement in the performance of integrated circuits. Miniaturization allows the integration of a larger number of transistors with enhanced switching speed. Novel transistor structures and passivation materials diminish circuit delay by minimizing parasitic electrical capacitance. These advances, however, pose several challenges for the thermal engineering of integrated circuits. The low thermal conductivities of passivation layers result in large temperature rises and temperature gradient magni tudes, which degrade electrical characteristics of transistors and reduce lifetimes of interconnects. As dimensions of transistors and interconnects decrease, the result ing changes in current density and thermal capacitance make these elements more susceptible to failure during brief electrical overstress. This work develops a set of high-resolution measurement techniques which de termine temperature fields in transistors and interconnects, as well as the thermal properties of their constituent films. At the heart of these techniques is the thermore flectance thermometry method, which is based on the temperature dependence of the reflectance of metals. Spatial resolution near 300 nm and temporal resolution near IOns are demonstrated by capturing transient temperature distributions in intercon nects and silicon-on-insulator (SOl) high-voltage transistors. Analyses of transient temperature data obtained from interconnect structures yield thermal conductivities and volumetric heat capacities of thin films.
Vendeur : GreatBookPricesUK, Woodford Green, Royaume-Uni
EUR 168,30
Quantité disponible : Plus de 20 disponibles
Ajouter au panierEtat : As New. Unread book in perfect condition.
Vendeur : Mispah books, Redhill, SURRE, Royaume-Uni
EUR 158,70
Quantité disponible : 1 disponible(s)
Ajouter au panierHardcover. Etat : Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
Vendeur : GreatBookPrices, Columbia, MD, Etats-Unis
EUR 191,13
Quantité disponible : Plus de 20 disponibles
Ajouter au panierEtat : As New. Unread book in perfect condition.
Vendeur : Buchpark, Trebbin, Allemagne
EUR 82,49
Quantité disponible : 1 disponible(s)
Ajouter au panierEtat : Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher | Advances in the semiconductor technology have enabled steady, exponential im provement in the performance of integrated circuits. Miniaturization allows the integration of a larger number of transistors with enhanced switching speed. Novel transistor structures and passivation materials diminish circuit delay by minimizing parasitic electrical capacitance. These advances, however, pose several challenges for the thermal engineering of integrated circuits. The low thermal conductivities of passivation layers result in large temperature rises and temperature gradient magni tudes, which degrade electrical characteristics of transistors and reduce lifetimes of interconnects. As dimensions of transistors and interconnects decrease, the result ing changes in current density and thermal capacitance make these elements more susceptible to failure during brief electrical overstress. This work develops a set of high-resolution measurement techniques which de termine temperature fields in transistors and interconnects, as well as the thermal properties of their constituent films. At the heart of these techniques is the thermore flectance thermometry method, which is based on the temperature dependence of the reflectance of metals. Spatial resolution near 300 nm and temporal resolution near IOns are demonstrated by capturing transient temperature distributions in intercon nects and silicon-on-insulator (SOl) high-voltage transistors. Analyses of transient temperature data obtained from interconnect structures yield thermal conductivities and volumetric heat capacities of thin films.
Vendeur : Mispah books, Redhill, SURRE, Royaume-Uni
EUR 186,35
Quantité disponible : 1 disponible(s)
Ajouter au panierPaperback. Etat : Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne
EUR 53,49
Quantité disponible : 2 disponible(s)
Ajouter au panierTaschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Advances in the semiconductor technology have enabled steady, exponential im provement in the performance of integrated circuits. Miniaturization allows the integration of a larger number of transistors with enhanced switching speed. Novel transistor structures and passivation materials diminish circuit delay by minimizing parasitic electrical capacitance. These advances, however, pose several challenges for the thermal engineering of integrated circuits. The low thermal conductivities of passivation layers result in large temperature rises and temperature gradient magni tudes, which degrade electrical characteristics of transistors and reduce lifetimes of interconnects. As dimensions of transistors and interconnects decrease, the result ing changes in current density and thermal capacitance make these elements more susceptible to failure during brief electrical overstress. This work develops a set of high-resolution measurement techniques which de termine temperature fields in transistors and interconnects, as well as the thermal properties of their constituent films. At the heart of these techniques is the thermore flectance thermometry method, which is based on the temperature dependence of the reflectance of metals. Spatial resolution near 300 nm and temporal resolution near IOns are demonstrated by capturing transient temperature distributions in intercon nects and silicon-on-insulator (SOl) high-voltage transistors. Analyses of transient temperature data obtained from interconnect structures yield thermal conductivities and volumetric heat capacities of thin films. 128 pp. Englisch.
Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne
EUR 106,99
Quantité disponible : 2 disponible(s)
Ajouter au panierBuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Advances in the semiconductor technology have enabled steady, exponential im provement in the performance of integrated circuits. Miniaturization allows the integration of a larger number of transistors with enhanced switching speed. Novel transistor structures and passivation materials diminish circuit delay by minimizing parasitic electrical capacitance. These advances, however, pose several challenges for the thermal engineering of integrated circuits. The low thermal conductivities of passivation layers result in large temperature rises and temperature gradient magni tudes, which degrade electrical characteristics of transistors and reduce lifetimes of interconnects. As dimensions of transistors and interconnects decrease, the result ing changes in current density and thermal capacitance make these elements more susceptible to failure during brief electrical overstress. This work develops a set of high-resolution measurement techniques which de termine temperature fields in transistors and interconnects, as well as the thermal properties of their constituent films. At the heart of these techniques is the thermore flectance thermometry method, which is based on the temperature dependence of the reflectance of metals. Spatial resolution near 300 nm and temporal resolution near IOns are demonstrated by capturing transient temperature distributions in intercon nects and silicon-on-insulator (SOl) high-voltage transistors. Analyses of transient temperature data obtained from interconnect structures yield thermal conductivities and volumetric heat capacities of thin films. 132 pp. Englisch.
Vendeur : moluna, Greven, Allemagne
EUR 92,27
Quantité disponible : Plus de 20 disponibles
Ajouter au panierEtat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Preface. Foreword. Acknowledgements. Nomenclature. 1. Introduction. 2. Review of Microscale Thermometry Techniques. 3. High Spatial and Temporal Resolution Thermometry. 4. Thermal Properties of Amorphous Dielectric Films. 5. Heat Conduction in Crystalli.
Vendeur : moluna, Greven, Allemagne
EUR 92,27
Quantité disponible : Plus de 20 disponibles
Ajouter au panierGebunden. Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Preface. Foreword. Acknowledgements. Nomenclature. 1. Introduction. 2. Review of Microscale Thermometry Techniques. 3. High Spatial and Temporal Resolution Thermometry. 4. Thermal Properties of Amorphous Dielectric Films. 5. Heat Conduction in Crystalli.
Langue: anglais
Edité par Springer Berlin Heidelberg, 2011
ISBN 10 : 3642072828 ISBN 13 : 9783642072826
Vendeur : moluna, Greven, Allemagne
EUR 92,27
Quantité disponible : Plus de 20 disponibles
Ajouter au panierEtat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Heat sinks is a topic related to functioning of electronic microdevicesThis topic is systematically presented in this book for the first timeTwo-phase microchannel cooling is one of the most promising thermal-management technologies for.
Langue: anglais
Edité par Springer Berlin Heidelberg, 2003
ISBN 10 : 3540401814 ISBN 13 : 9783540401810
Vendeur : moluna, Greven, Allemagne
EUR 92,27
Quantité disponible : Plus de 20 disponibles
Ajouter au panierGebunden. Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Heat sinks is a topic related to functioning of electronic microdevicesThis topic is systematically presented in this book for the first timeTwo-phase microchannel cooling is one of the most promising thermal-management technologies for.
Vendeur : Majestic Books, Hounslow, Royaume-Uni
EUR 150,36
Quantité disponible : 4 disponible(s)
Ajouter au panierEtat : New. Print on Demand pp. 132 52:B&W 6.14 x 9.21in or 234 x 156mm (Royal 8vo) Case Laminate on White w/Gloss Lam.
Vendeur : Majestic Books, Hounslow, Royaume-Uni
EUR 153,19
Quantité disponible : 4 disponible(s)
Ajouter au panierEtat : New. Print on Demand pp. ix + 140 106 Illus.
Vendeur : Biblios, Frankfurt am main, HESSE, Allemagne
EUR 151,07
Quantité disponible : 4 disponible(s)
Ajouter au panierEtat : New. PRINT ON DEMAND pp. 132.
Vendeur : Biblios, Frankfurt am main, HESSE, Allemagne
EUR 153,77
Quantité disponible : 4 disponible(s)
Ajouter au panierEtat : New. PRINT ON DEMAND pp. ix + 140.