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Langue: anglais
Edité par Taylor & Francis Ltd, London, 2020
ISBN 10 : 0367655993 ISBN 13 : 9780367655990
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Ajouter au panierPaperback. Etat : new. Paperback. Soft errors are a multifaceted issue at the crossroads of applied physics and engineering sciences. Soft errors are by nature multiscale and multiphysics problems that combine not only nuclear and semiconductor physics, material sciences, circuit design, and chip architecture and operation, but also cosmic-ray physics, natural radioactivity issues, particle detection, and related instrumentation.Soft Errors: From Particles to Circuits addresses the problem of soft errors in digital integrated circuits subjected to the terrestrial natural radiation environmentone of the most important primary limits for modern digital electronic reliability. Covering the fundamentals of soft errors as well as engineering considerations and technological aspects, this robust text:Discusses the basics of the natural radiation environment, particle interactions with matter, and soft-error mechanismsDetails instrumentation developments in the fields of environment characterization, particle detection, and real-time and accelerated testsDescribes the latest computational developments, modeling, and simulation strategies for the soft error-rate estimation in digital circuitsExplores trends for future technological nodes and emerging devicesSoft Errors: From Particles to Circuits presents the state of the art of this complex subject, providing comprehensive knowledge of the complete chain of the physics of soft errors. The book makes an ideal text for introductory graduate-level courses, offers academic researchers a specialized overview, and serves as a practical guide for semiconductor industry engineers or application engineers. This book addresses the problem of soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment, providing comprehensive knowledge of the complete chain of the physics of soft errors. The text discusses particle interactions with matter, soft-error mechanisms, and instrumentation developments in environme Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
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Edité par Taylor & Francis Ltd, London, 2020
ISBN 10 : 0367655993 ISBN 13 : 9780367655990
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Ajouter au panierPaperback. Etat : new. Paperback. Soft errors are a multifaceted issue at the crossroads of applied physics and engineering sciences. Soft errors are by nature multiscale and multiphysics problems that combine not only nuclear and semiconductor physics, material sciences, circuit design, and chip architecture and operation, but also cosmic-ray physics, natural radioactivity issues, particle detection, and related instrumentation.Soft Errors: From Particles to Circuits addresses the problem of soft errors in digital integrated circuits subjected to the terrestrial natural radiation environmentone of the most important primary limits for modern digital electronic reliability. Covering the fundamentals of soft errors as well as engineering considerations and technological aspects, this robust text:Discusses the basics of the natural radiation environment, particle interactions with matter, and soft-error mechanismsDetails instrumentation developments in the fields of environment characterization, particle detection, and real-time and accelerated testsDescribes the latest computational developments, modeling, and simulation strategies for the soft error-rate estimation in digital circuitsExplores trends for future technological nodes and emerging devicesSoft Errors: From Particles to Circuits presents the state of the art of this complex subject, providing comprehensive knowledge of the complete chain of the physics of soft errors. The book makes an ideal text for introductory graduate-level courses, offers academic researchers a specialized overview, and serves as a practical guide for semiconductor industry engineers or application engineers. This book addresses the problem of soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment, providing comprehensive knowledge of the complete chain of the physics of soft errors. The text discusses particle interactions with matter, soft-error mechanisms, and instrumentation developments in environme Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.
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Ajouter au panierPaperback. Etat : Brand New. 439 pages. 10.00x7.00x0.98 inches. In Stock.
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Ajouter au panierGebunden. Etat : New. Jean-Luc Autran is distinguished professor of physics and electrical engineering at Aix-Marseille University and honorary member of the University Institute of France (IUF). He is also deputy director of the Institute for Materials, Micr.
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Ajouter au panierEtat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Jean-Luc Autran is distinguished professor of physics and electrical engineering at Aix-Marseille University and honorary member of the University Institute of France (IUF). He is also deputy director of the Institute for Materials, Micr.
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Ajouter au panierHardcover. Etat : new. Hardcover. This book, Advances in Semiconductor Physics, Devices and Quantum Dots - Nanotechnology and Future Challenges, is a compilation of chapters on research in the fields of semiconductor physics, devices, and quantum dots. The chapters have been reviewed, and they offer a complete overview of what has been developed recently. The book comprises chapters written by various researchers and reviewed by experts in nanotechnology and engineering. Each chapter is complete in itself, but they are all connected by a common research study topic. This publication aims to provide a thorough overview of the latest research efforts by international authors in the field. It also aims to open new possible research paths for further novel developments. This item is printed on demand. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
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Ajouter au panierBuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware 172 pp. Englisch.
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Ajouter au panierHardcover. Etat : new. Hardcover. This book, Advances in Semiconductor Physics, Devices and Quantum Dots - Nanotechnology and Future Challenges, is a compilation of chapters on research in the fields of semiconductor physics, devices, and quantum dots. The chapters have been reviewed, and they offer a complete overview of what has been developed recently. The book comprises chapters written by various researchers and reviewed by experts in nanotechnology and engineering. Each chapter is complete in itself, but they are all connected by a common research study topic. This publication aims to provide a thorough overview of the latest research efforts by international authors in the field. It also aims to open new possible research paths for further novel developments. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.
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Ajouter au panierBuch. Etat : Neu. This item is printed on demand - Print on Demand Titel. Neuware Books on Demand GmbH, Überseering 33, 22297 Hamburg 172 pp. Englisch.
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Ajouter au panierBuch. Etat : Neu. nach der Bestellung gedruckt Neuware - Printed after ordering.
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Ajouter au panierBuch. Etat : Neu. Advances in Semiconductor Physics, Devices and Quantum Dots - Nanotechnology and Future Challenges | Nanotechnology and Future Challenges | Tingting Yin (u. a.) | Buch | Englisch | 2025 | IntechOpen | EAN 9780854665129 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu Print on Demand.
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Ajouter au panierEtat : New. PRINT ON DEMAND pp. 439 Acknowledgements.