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  • Langue : anglais

    Edité par Springer, 1996

    3211828745 / 9783211828748

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    Vendeur : GreatBookPrices, Columbia, MD, Etats-UnisGreatBookPrices

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    Etat: Neuf

    EUR 126,62

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    Etat : New.

  • Langue : anglais

    Edité par Springer, 1996

    3211828745 / 9783211828748

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    Vendeur : California Books, Miami, FL, Etats-UnisCalifornia Books

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    EUR 129,04

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    Etat : New.

  • Langue : anglais

    Edité par Springer 1996-11-06, 1996

    3211828745 / 9783211828748

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    Vendeur : Chiron Media, Wallingford, Royaume-UniChiron Media

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    Etat: Neuf

    EUR 115,43

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    Paperback. Etat : New.

  • Langue : anglais

    Edité par Springer, 1996

    3211828745 / 9783211828748

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    Vendeur : GreatBookPricesUK, Woodford Green, Royaume-UniGreatBookPricesUK

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    Etat: Neuf

    EUR 118,43

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    Etat : New.

  • Langue : anglais

    Edité par Springer, 1996

    3211828745 / 9783211828748

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    Vendeur : Ria Christie Collections, Uxbridge, Royaume-UniRia Christie Collections

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    Etat: Neuf

    EUR 129,33

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    Etat : New. In English.

  • Langue : anglais

    Edité par Springer, 1996

    3211828745 / 9783211828748

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    Vendeur : AHA-BUCH GmbH, Einbeck, AllemagneAHA-BUCH GmbH

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    Etat: Neuf

    EUR 114,00

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    Quantité disponible : 1 disponible

    Taschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - This supplement of Mikrochimica Acta contains selected papers from the Fourth Workshop of the European Microanalysis Society (EMAS) on 'Modern Develop ments and Applications in Microbeam Analysis' which took place in May 1995 in Saint Malo (France). EMAS was founded in 1986 by members from almost all european countries in order to stimulate research, applications and development of all forms of microbeam methods. One important EMAS activity is the organisation of biennial workshops for demonstrating the current status and developing trends of microanalytical techniques. For this meeting, EMAS chose to highlight the following topics: Monte-Carlo simula tions, transport calculations and use of soft X-rays for electron probe microanalysis (EPMA), dynamic secondary ion mass spectrometry (SIMS), detection of small quan tities using different techniques: synchrotron radiation X-ray fluorescence, particle in duced X-ray emission (PIXE), cathodoluminescence microscopy (CL). Two new kinds of instrumental techniques were also presented: atomic probe and scanning probe microscopy (STM). The aim of the conference is to give introductory lectures corresponding to the topics of the meeting and to have contributions in the form of po ster sessions. More than 80 posters were presented. Most of them gave a short oral pre sentation. The poster subjects were related to the use of microanalytical techniques: EPMA with wavelength dispersive spectrometry (WDS) and energy dispersive spec trometry (EDS), Auger electron spectrometry (AES), secondary ion mass spectro metry (SIMS), scanning electron microscopy and other topographical methods like scanning tunneling microscopy (STM) or atomic force microscopy (AFM).…

  • Langue : anglais

    Edité par Springer Verlag GmbH, AT, 1996

    3211828745 / 9783211828748

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    Vendeur : Rarewaves.com USA, London, LONDO, Royaume-UniRarewaves.com USA

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    Etat: Neuf

    EUR 166,25

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    Paperback. Etat : New. This supplement of Mikrochimica Acta contains selected papers from the Fourth Workshop of the European Microanalysis Society (EMAS) on "Modern Develop- ments and Applications in Microbeam Analysis" which took place in May 1995 in Saint Malo (France). EMAS was founded in 1986 by members from almost all european countries in order to stimulate research, applications and development of all forms of microbeam methods. One important EMAS activity is the organisation of biennial workshops for demonstrating the current status and developing trends of microanalytical techniques. For this meeting, EMAS chose to highlight the following topics: Monte-Carlo simula- tions, transport calculations and use of soft X-rays for electron probe microanalysis (EPMA), dynamic secondary ion mass spectrometry (SIMS), detection of small quan- tities using different techniques: synchrotron radiation X-ray fluorescence, particle in- duced X-ray emission (PIXE), cathodoluminescence microscopy (CL). Two new kinds of instrumental techniques were also presented: atomic probe and scanning probe microscopy (STM).The aim of the conference is to give introductory lectures corresponding to the topics of the meeting and to have contributions in the form of po- ster sessions. More than 80 posters were presented. Most of them gave a short oral pre- sentation. The poster subjects were related to the use of microanalytical techniques: EPMA with wavelength dispersive spectrometry (WDS) and energy dispersive spec- trometry (EDS), Auger electron spectrometry (AES), secondary ion mass spectro- metry (SIMS), scanning electron microscopy and other topographical methods like scanning tunneling microscopy (STM) or atomic force microscopy (AFM). Softcover reprint of the original 1st ed. 1996.…

  • Langue : anglais

    Edité par Springer, 1996

    3211828745 / 9783211828748

    • Couverture souple

    Vendeur : GreatBookPricesUK, Woodford Green, Royaume-UniGreatBookPricesUK

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    Etat: Occasion - Comme neuf

    EUR 170,87

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    Quantité disponible : Plus de 20 disponibles

    Etat : As New. Unread book in perfect condition.

  • Langue : anglais

    Edité par Springer, 1996

    3211828745 / 9783211828748

    • Couverture souple

    Vendeur : Mispah books, Redhill, SURRE, Royaume-UniMispah books

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    Etat: Occasion - Comme neuf

    EUR 161,19

    EUR 29,42 expédition 
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    Quantité disponible : 1 disponible

    Paperback. Etat : Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

  • Langue : anglais

    Edité par Springer Verlag, 1996

    3211828745 / 9783211828748

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    Vendeur : Revaluation Books, Exeter, Royaume-UniRevaluation Books

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    Etat: Neuf

    EUR 169,52

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    Quantité disponible : 2 disponibles

    Paperback. Etat : Brand New. 650 pages. 10.94x8.27x1.50 inches. In Stock.

  • Langue : anglais

    Edité par Springer, 1996

    3211828745 / 9783211828748

    • Couverture souple

    Vendeur : GreatBookPrices, Columbia, MD, Etats-UnisGreatBookPrices

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    Etat: Occasion - Comme neuf

    EUR 193,91

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    Etat : As New. Unread book in perfect condition.

  • Langue : anglais

    Edité par Springer Verlag GmbH, AT, 1996

    3211828745 / 9783211828748

    • Couverture souple

    Vendeur : Rarewaves.com UK, London, Royaume-UniRarewaves.com UK

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    Etat: Neuf

    EUR 159,01

    EUR 76,48 expédition 
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    Paperback. Etat : New. This supplement of Mikrochimica Acta contains selected papers from the Fourth Workshop of the European Microanalysis Society (EMAS) on "Modern Develop- ments and Applications in Microbeam Analysis" which took place in May 1995 in Saint Malo (France). EMAS was founded in 1986 by members from almost all european countries in order to stimulate research, applications and development of all forms of microbeam methods. One important EMAS activity is the organisation of biennial workshops for demonstrating the current status and developing trends of microanalytical techniques. For this meeting, EMAS chose to highlight the following topics: Monte-Carlo simula- tions, transport calculations and use of soft X-rays for electron probe microanalysis (EPMA), dynamic secondary ion mass spectrometry (SIMS), detection of small quan- tities using different techniques: synchrotron radiation X-ray fluorescence, particle in- duced X-ray emission (PIXE), cathodoluminescence microscopy (CL). Two new kinds of instrumental techniques were also presented: atomic probe and scanning probe microscopy (STM).The aim of the conference is to give introductory lectures corresponding to the topics of the meeting and to have contributions in the form of po- ster sessions. More than 80 posters were presented. Most of them gave a short oral pre- sentation. The poster subjects were related to the use of microanalytical techniques: EPMA with wavelength dispersive spectrometry (WDS) and energy dispersive spec- trometry (EDS), Auger electron spectrometry (AES), secondary ion mass spectro- metry (SIMS), scanning electron microscopy and other topographical methods like scanning tunneling microscopy (STM) or atomic force microscopy (AFM). Softcover reprint of the original 1st ed. 1996.…

  • Langue : anglais

    Edité par Springer Vienna, Springer Vienna Nov 1996, 1996

    3211828745 / 9783211828748

    • Couverture souple
    • impression à la demande

    Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, AllemagneBuchWeltWeit Ludwig Meier e.K.

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    Etat: Neuf

    EUR 106,99

    EUR 23,00 expédition 
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    Quantité disponible : 2 disponibles

    Taschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This supplement of Mikrochimica Acta contains selected papers from the Fourth Workshop of the European Microanalysis Society (EMAS) on 'Modern Develop ments and Applications in Microbeam Analysis' which took place in May 1995 in Saint Malo (France). EMAS was founded in 1986 by members from almost all european countries in order to stimulate research, applications and development of all forms of microbeam methods. One important EMAS activity is the organisation of biennial workshops for demonstrating the current status and developing trends of microanalytical techniques. For this meeting, EMAS chose to highlight the following topics: Monte-Carlo simula tions, transport calculations and use of soft X-rays for electron probe microanalysis (EPMA), dynamic secondary ion mass spectrometry (SIMS), detection of small quan tities using different techniques: synchrotron radiation X-ray fluorescence, particle in duced X-ray emission (PIXE), cathodoluminescence microscopy (CL). Two new kinds of instrumental techniques were also presented: atomic probe and scanning probe microscopy (STM). The aim of the conference is to give introductory lectures corresponding to the topics of the meeting and to have contributions in the form of po ster sessions. More than 80 posters were presented. Most of them gave a short oral pre sentation. The poster subjects were related to the use of microanalytical techniques: EPMA with wavelength dispersive spectrometry (WDS) and energy dispersive spec trometry (EDS), Auger electron spectrometry (AES), secondary ion mass spectro metry (SIMS), scanning electron microscopy and other topographical methods like scanning tunneling microscopy (STM) or atomic force microscopy (AFM). 660 pp. Englisch.…

  • Langue : anglais

    Edité par Springer Vienna, 1996

    3211828745 / 9783211828748

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    Vendeur : moluna, Greven, Allemagnemoluna

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    Etat: Neuf

    EUR 92,27

    EUR 48,99 expédition 
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    Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Monte Carlo Simulation Techniques for Quantitative X-Ray Microanalysis.- Transport Equation Approach to Electron Microbeam Analysis: Fundamentals and Applications.- Use of Soft X-Rays in Microanalysis.- Intensity Measurement of Wavelength Dispersive X-Ray E.…

  • Langue : anglais

    Edité par Springer Vienna, Springer Nov 1996, 1996

    3211828745 / 9783211828748

    • Couverture souple
    • impression à la demande

    Vendeur : buchversandmimpf2000, Emtmannsberg, BAYE, Allemagnebuchversandmimpf2000

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    Etat: Neuf

    EUR 106,99

    EUR 60,00 expédition 
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    Quantité disponible : 1 disponible

    Taschenbuch. Etat : Neu. This item is printed on demand - Print on Demand Titel. Neuware -This supplement of Mikrochimica Acta contains selected papers from the Fourth Workshop of the European Microanalysis Society (EMAS) on 'Modern Develop ments and Applications in Microbeam Analysis' which took place in May 1995 in Saint Malo (France). EMAS was founded in 1986 by members from almost all european countries in order to stimulate research, applications and development of all forms of microbeam methods. One important EMAS activity is the organisation of biennial workshops for demonstrating the current status and developing trends of microanalytical techniques. For this meeting, EMAS chose to highlight the following topics: Monte-Carlo simula tions, transport calculations and use of soft X-rays for electron probe microanalysis (EPMA), dynamic secondary ion mass spectrometry (SIMS), detection of small quan tities using different techniques: synchrotron radiation X-ray fluorescence, particle in duced X-ray emission (PIXE), cathodoluminescence microscopy (CL). Two new kinds of instrumental techniques were also presented: atomic probe and scanning probe microscopy (STM). The aim of the conference is to give introductory lectures corresponding to the topics of the meeting and to have contributions in the form of po ster sessions. More than 80 posters were presented. Most of them gave a short oral pre sentation. The poster subjects were related to the use of microanalytical techniques: EPMA with wavelength dispersive spectrometry (WDS) and energy dispersive spec trometry (EDS), Auger electron spectrometry (AES), secondary ion mass spectro metry (SIMS), scanning electron microscopy and other topographical methods like scanning tunneling microscopy (STM) or atomic force microscopy (AFM).Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 660 pp. Englisch.…