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advanced materials characterization de kumar sateesh (37 résultats)
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Advanced Materials Characterization
Vendeur : PBShop.store US, Wood Dale, IL, Etats-Unis
Évaluation du vendeur 5 sur 5 étoiles
EUR 57,41
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Ajouter au panierPAP. Etat : New. New Book. Shipped from UK. Established seller since 2000.
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Advanced Materials Characterization
Vendeur : PBShop.store UK, Fairford, GLOS, Royaume-Uni
Évaluation du vendeur 5 sur 5 étoiles
EUR 55,67
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Ajouter au panierPAP. Etat : New. New Book. Shipped from UK. Established seller since 2000.
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Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions (Advanced Materials Processing and Manufacturing)
Vendeur : Books Puddle, New York, NY, Etats-Unis
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EUR 59,25
EUR 3,43 shipping
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Ajouter au panierEtat : New. 1st edition NO-PA16APR2015-KAP.
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Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions (Advanced Materials Processing and Manufacturing)
Vendeur : Majestic Books, Hounslow, Royaume-Uni
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EUR 61,13
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Advanced Materials Characterization
Edité par Taylor and Francis Ltd, GB, 2024
ISBN 10 : 1032375116 ISBN 13 : 9781032375113
Langue: anglais
Vendeur : Rarewaves.com USA, London, LONDO, Royaume-Uni
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EUR 71,58
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Ajouter au panierPaperback. Etat : New. The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. It explores the techniques implemented for advanced materials like superalloys, thin films, powders, nanocomposites, polymers, shape memory alloys, high entropy alloys, and so on. Major instruments covered include X-ray diffraction, near-field scanning optical microscopy Raman, X-ray photospectroscopy, ultraviolet-visible-near-infrared spectrosphotometer, Fourier-transform infrared spectroscopy, differential scanning calorimeter, profilometer, and thermogravimetric analysis. Features:Covers material characterization techniques and the development of advanced characterization technology Includes multiple length scale characterization approaches for a large variety of materials, from nano- to micron-scale, as well as their constraints Discusses advanced material characterization technology in the microstructural and property characterization fields Reviews both practical and theoretical explanations of approaches for characterizing microstructure and properties Offers fundamentals, basic instrumentation details, experimental approaches, analyses, and applications with case studies This book is aimed at graduate students and researchers in materials science and engineering.
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Advanced Materials Characterization (Paperback)
Edité par Taylor & Francis Ltd, London, 2024
ISBN 10 : 1032375116 ISBN 13 : 9781032375113
Langue: anglais
Vendeur : Grand Eagle Retail, Bensenville, IL, Etats-Unis
Évaluation du vendeur 5 sur 5 étoiles
EUR 72,25
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Ajouter au panierPaperback. Etat : new. Paperback. The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. It explores the techniques implemented for advanced materials like superalloys, thin films, powders, nanocomposites, polymers, shape memory alloys, high entropy alloys, and so on. Major instruments covered include X-ray diffraction, near-field scanning optical microscopy Raman, X-ray photospectroscopy, ultraviolet-visible-near-infrared spectrosphotometer, Fourier-transform infrared spectroscopy, differential scanning calorimeter, profilometer, and thermogravimetric analysis. Features:Covers material characterization techniques and the development of advanced characterization technology Includes multiple length scale characterization approaches for a large variety of materials, from nano- to micron-scale, as well as their constraints Discusses advanced material characterization technology in the microstructural and property characterization fields Reviews both practical and theoretical explanations of approaches for characterizing microstructure and properties Offers fundamentals, basic instrumentation details, experimental approaches, analyses, and applications with case studies This book is aimed at graduate students and researchers in materials science and engineering. The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
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Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions (Advanced Materials Processing and Manufacturing)
Vendeur : Ria Christie Collections, Uxbridge, Royaume-Uni
Évaluation du vendeur 5 sur 5 étoiles
EUR 59,31
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Ajouter au panierEtat : New. In.
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Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions (Advanced Materials Processing and Manufacturing)
Vendeur : Chiron Media, Wallingford, Royaume-Uni
Évaluation du vendeur 5 sur 5 étoiles
EUR 55,63
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Ajouter au panierpaperback. Etat : New.
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Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions
Vendeur : THE SAINT BOOKSTORE, Southport, Royaume-Uni
Évaluation du vendeur 5 sur 5 étoiles
EUR 58,77
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Ajouter au panierPaperback / softback. Etat : New. New copy - Usually dispatched within 4 working days.
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Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions
Vendeur : Revaluation Books, Exeter, Royaume-Uni
Évaluation du vendeur 5 sur 5 étoiles
EUR 67,82
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Ajouter au panierPaperback. Etat : Brand New. 144 pages. 9.18x6.12x9.21 inches. In Stock.
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Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions (Advanced Materials Processing and Manufacturing)
Vendeur : Kennys Bookshop and Art Galleries Ltd., Galway, GY, Irlande
Évaluation du vendeur 5 sur 5 étoiles
Edition originale
EUR 67,52
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Ajouter au panierEtat : New. 2024. 1st Edition. paperback. . . . . .
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Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions (Advanced Materials Processing and Manufacturing)
Vendeur : Kennys Bookstore, Olney, MD, Etats-Unis
Évaluation du vendeur 5 sur 5 étoiles
EUR 83,14
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Ajouter au panierEtat : New. 2024. 1st Edition. paperback. . . . . . Books ship from the US and Ireland.
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Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions
Vendeur : Revaluation Books, Exeter, Royaume-Uni
Évaluation du vendeur 5 sur 5 étoiles
EUR 85,52
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Ajouter au panierPaperback. Etat : Brand New. 144 pages. 9.18x6.12x9.21 inches. In Stock.
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EUR 52,35
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Advanced Materials Characterization : Basic Principles, Novel Applications, and Future Directions
Vendeur : GreatBookPrices, Columbia, MD, Etats-Unis
Évaluation du vendeur 5 sur 5 étoiles
EUR 135,34
EUR 2,27 shipping
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Ajouter au panierEtat : As New. Unread book in perfect condition.
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Advanced Materials Characterization
Edité par Taylor and Francis Ltd, GB, 2024
ISBN 10 : 1032375116 ISBN 13 : 9781032375113
Langue: anglais
Vendeur : Rarewaves.com UK, London, Royaume-Uni
Évaluation du vendeur 5 sur 5 étoiles
EUR 66,80
EUR 74,41 shipping
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Ajouter au panierPaperback. Etat : New. The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. It explores the techniques implemented for advanced materials like superalloys, thin films, powders, nanocomposites, polymers, shape memory alloys, high entropy alloys, and so on. Major instruments covered include X-ray diffraction, near-field scanning optical microscopy Raman, X-ray photospectroscopy, ultraviolet-visible-near-infrared spectrosphotometer, Fourier-transform infrared spectroscopy, differential scanning calorimeter, profilometer, and thermogravimetric analysis. Features:Covers material characterization techniques and the development of advanced characterization technology Includes multiple length scale characterization approaches for a large variety of materials, from nano- to micron-scale, as well as their constraints Discusses advanced material characterization technology in the microstructural and property characterization fields Reviews both practical and theoretical explanations of approaches for characterizing microstructure and properties Offers fundamentals, basic instrumentation details, experimental approaches, analyses, and applications with case studies This book is aimed at graduate students and researchers in materials science and engineering.
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Advanced Materials Characterization : Basic Principles, Novel Applications, and Future Directions
Vendeur : GreatBookPrices, Columbia, MD, Etats-Unis
Évaluation du vendeur 5 sur 5 étoiles
EUR 142,79
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Ajouter au panierEtat : New.
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Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions
Vendeur : Books Puddle, New York, NY, Etats-Unis
Évaluation du vendeur 4 sur 5 étoiles
EUR 141,61
EUR 3,43 shipping
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EUR 72,55
EUR 70 shipping
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Ajouter au panierTaschenbuch. Etat : Neu. Advanced Materials Characterization | Basic Principles, Novel Applications, and Future Directions | Ch Sateesh Kumar (u. a.) | Taschenbuch | Einband - flex.(Paperback) | Englisch | 2024 | CRC Press | EAN 9781032375113 | Verantwortliche Person für die EU: Libri GmbH, Europaallee 1, 36244 Bad Hersfeld, gpsr[at]libri[dot]de | Anbieter: preigu.
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Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions
Vendeur : THE SAINT BOOKSTORE, Southport, Royaume-Uni
Évaluation du vendeur 5 sur 5 étoiles
EUR 141,62
EUR 14,42 shipping
Ships from Royaume-Uni to Etats-UnisQuantité disponible : 1 disponible(s)
Ajouter au panierHardback. Etat : New. New copy - Usually dispatched within 4 working days. 185.
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Advanced Materials Characterization : Basic Principles, Novel Applications, and Future Directions
Vendeur : GreatBookPricesUK, Woodford Green, Royaume-Uni
Évaluation du vendeur 5 sur 5 étoiles
EUR 141,61
EUR 17,17 shipping
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Ajouter au panierEtat : New.
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Advanced Materials Characterization (Advanced Materials Processing and Manufacturing)
Vendeur : California Books, Miami, FL, Etats-Unis
Évaluation du vendeur 5 sur 5 étoiles
EUR 157,50
Livraison gratuite
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Ajouter au panierEtat : New.
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Advanced Materials Characterization : Basic Principles, Novel Applications, and Future Directions
Vendeur : GreatBookPricesUK, Woodford Green, Royaume-Uni
Évaluation du vendeur 5 sur 5 étoiles
EUR 140,67
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Ajouter au panierEtat : As New. Unread book in perfect condition.
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Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions
Vendeur : Revaluation Books, Exeter, Royaume-Uni
Évaluation du vendeur 5 sur 5 étoiles
EUR 205,34
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Ajouter au panierHardcover. Etat : Brand New. 160 pages. 9.19x6.13x0.52 inches. In Stock.
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Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions (Advanced Materials Processing and Manufacturing)
Vendeur : Biblios, Frankfurt am main, HESSE, Allemagne
Évaluation du vendeur 4 sur 5 étoiles
EUR 67,27
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Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions
Vendeur : THE SAINT BOOKSTORE, Southport, Royaume-Uni
Évaluation du vendeur 5 sur 5 étoiles
EUR 77,74
EUR 18,03 shipping
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Ajouter au panierPaperback / softback. Etat : New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days.
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Advanced Materials Characterization (Paperback)
Edité par Taylor & Francis Ltd, London, 2024
ISBN 10 : 1032375116 ISBN 13 : 9781032375113
Langue: anglais
Vendeur : CitiRetail, Stevenage, Royaume-Uni
Évaluation du vendeur 5 sur 5 étoiles
EUR 74,27
EUR 42,36 shipping
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Ajouter au panierPaperback. Etat : new. Paperback. The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. It explores the techniques implemented for advanced materials like superalloys, thin films, powders, nanocomposites, polymers, shape memory alloys, high entropy alloys, and so on. Major instruments covered include X-ray diffraction, near-field scanning optical microscopy Raman, X-ray photospectroscopy, ultraviolet-visible-near-infrared spectrosphotometer, Fourier-transform infrared spectroscopy, differential scanning calorimeter, profilometer, and thermogravimetric analysis. Features:Covers material characterization techniques and the development of advanced characterization technology Includes multiple length scale characterization approaches for a large variety of materials, from nano- to micron-scale, as well as their constraints Discusses advanced material characterization technology in the microstructural and property characterization fields Reviews both practical and theoretical explanations of approaches for characterizing microstructure and properties Offers fundamentals, basic instrumentation details, experimental approaches, analyses, and applications with case studies This book is aimed at graduate students and researchers in materials science and engineering. The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.
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Advanced Materials Characterization (Paperback)
Edité par Taylor & Francis Ltd, London, 2024
ISBN 10 : 1032375116 ISBN 13 : 9781032375113
Langue: anglais
Vendeur : AussieBookSeller, Truganina, VIC, Australie
Évaluation du vendeur 5 sur 5 étoiles
EUR 92,88
EUR 31,78 shipping
Ships from Australie to Etats-UnisQuantité disponible : 1 disponible(s)
Ajouter au panierPaperback. Etat : new. Paperback. The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. It explores the techniques implemented for advanced materials like superalloys, thin films, powders, nanocomposites, polymers, shape memory alloys, high entropy alloys, and so on. Major instruments covered include X-ray diffraction, near-field scanning optical microscopy Raman, X-ray photospectroscopy, ultraviolet-visible-near-infrared spectrosphotometer, Fourier-transform infrared spectroscopy, differential scanning calorimeter, profilometer, and thermogravimetric analysis. Features:Covers material characterization techniques and the development of advanced characterization technology Includes multiple length scale characterization approaches for a large variety of materials, from nano- to micron-scale, as well as their constraints Discusses advanced material characterization technology in the microstructural and property characterization fields Reviews both practical and theoretical explanations of approaches for characterizing microstructure and properties Offers fundamentals, basic instrumentation details, experimental approaches, analyses, and applications with case studies This book is aimed at graduate students and researchers in materials science and engineering. The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth. This item is printed on demand. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.
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Advanced Materials Characterization : Basic Principles, Novel Applications, and Future Directions
Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne
Évaluation du vendeur 5 sur 5 étoiles
EUR 64,74
EUR 61,16 shipping
Ships from Allemagne to Etats-UnisQuantité disponible : 1 disponible(s)
Ajouter au panierTaschenbuch. Etat : Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.
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Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions
Vendeur : Majestic Books, Hounslow, Royaume-Uni
Évaluation du vendeur 4 sur 5 étoiles
EUR 149,30
EUR 7,44 shipping
Ships from Royaume-Uni to Etats-UnisQuantité disponible : 4 disponible(s)
Ajouter au panierEtat : New. Print on Demand.
