Defect control semiconductors (3 résultats)
Langue : anglais
Edité par North-Holland, Amsterdam / New York / Oxford / Tokyo, 1990
- Couverture rigide
- Édition originale
Vendeur : About Books, Henderson, NV, Etats-UnisAbout Books
Contacter le vendeurVendeur avec une évaluation de 5 étoilesEtat: Neuf
EUR 249,45
EUR 6,01 expéditionExpédition nationale : Etats-UnisQuantité disponible : 1 disponible(s)
Hardcover. Etat : New. Etat de la jaquette : No dust jackets, as issued. First Editions. Amsterdam / New York / Oxford / Tokyo: North-Holland, 1990. New and unread. NOT a library discard. Complete in 2 huge volumes. Volume 1: xxviii, 972pp, xliv (author/subject index). Volume 2: xxvii, pp. 975 - 1,746, xxix-xliv (repeat of same…author/subject index). NO owner's name or bookplate. NOT a remainder. Sharp corners. Pages are crisp, clean and unmarked. NO underlining. NO highlighting. NO margin notes. Illustrated with figures, photos, charts, graphs, equations, etc. The two volumes are uniformly bound in the original gray and green cloth, stamped in yellow, white, green and black. From the publisher: "Defect control in semiconductors is a key technology for realizing the ultimate possibilities of modern electronics. The basis of such control lies in an integrated knowledge of a variety of defect properties. From this viewpoint, the volume discusses defect-related problems in connection with defect control in semiconducting materials, such as silicon, III-V, II-VI compounds, organic semiconductors, heterostructure, etc. The conference brought together scientists in the field of fundamental research and engineers involved in application related to electronic devices in order to promote future research activity in both fields and establish a fundamental knowledge of defect control. The main emphasis of the 254 papers presented in this volume is on the control of the concentration, distribution, structural and electronic states of any types of defects including impurities as well as control of the electrical, optical and other activities of defects." Two Oversize Hardcover volumes. This large, VERY heavy 2-volume set (over 10 pounds before packaging) will require SUBSTANTIAL extra postage for International shipments, but only the standard 1-volume charge for priority or media mail. . First Editions. Oversize Hardcover. New/No dust jackets, as issued. Illus. by NOT a library discard. 2 volumes, complete. Great Packaging, Fast Shipping. NOT a library discard (illustrateur).
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Vendeur : books4less (Versandantiquariat Petra Gros GmbH & Co. KG), Welling, Allemagnebooks4less (Versandantiquariat Petra Gros GmbH & Co. KG)
Contacter le vendeurVendeur avec une évaluation de 5 étoilesEtat: Occasion - Assez bon
EUR 288,00
EUR 49,95 expéditionExpédition depuis Allemagne vers Etats-UnisQuantité disponible : 1 disponible(s)
gebundene Ausgabe. Etat : Gut. 1746 Seiten; durchgehende Zählung; Der Erhaltungszustand des hier angebotenen Werks ist trotz seiner Bibliotheksnutzung sehr sauber. Es befindet sich neben dem Rückenschild lediglich ein Bibliotheksstempel im Buch; ordnungsgemäß entwidmet. In ENGLISCHER Sprache. KOMPLETTPREIS für 2 Bände; bei Versa…nd außerhalb der EU erfragen Sie bitte zuerst die Versandkosten; Sprache: Englisch Gewicht in Gramm: 4600.
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Vendeur : BUCHSERVICE / ANTIQUARIAT Lars Lutzer, Wahlstedt, AllemagneBUCHSERVICE / ANTIQUARIAT Lars Lutzer
Contacter le vendeurVendeur avec une évaluation de 5 étoilesEtat: Occasion - Assez bon
EUR 799,90
EUR 39,95 expéditionExpédition depuis Allemagne vers Etats-UnisQuantité disponible : 1 disponible(s)
Etat : gut. 1990. Defect Control in Semiconductors: Proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors The Yokohama 21st Century Forum Yokohama, Japan, September 17-22, 1989 (2 vols.set/ 2 Bände KOMPLETT) In englischer Sprache. pages.
