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design at speed test diagnosis (36 résultats)
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Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing, 15)
Vendeur : HPB-Red, Dallas, TX, Etats-Unis
Évaluation du vendeur 5 sur 5 étoiles
EUR 9,38
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Ajouter au panierHardcover. Etat : Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
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Design for At-Speed Test, Diagnosis and Measurement
Vendeur : ThriftBooks-Dallas, Dallas, TX, Etats-Unis
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EUR 12,88
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Ajouter au panierHardcover. Etat : Very Good. No Jacket. May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less.
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Design for at-Speed Test, Diagnosis and Measurement
Vendeur : Better World Books: West, Reno, NV, Etats-Unis
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EUR 12,91
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Ajouter au panierEtat : Fine. Used book that is in almost brand-new condition.
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Design for at-Speed Test, Diagnosis and Measurement
Vendeur : Better World Books, Mishawaka, IN, Etats-Unis
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EUR 12,91
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Ajouter au panierEtat : Good. Former library book; may include library markings. Used book that is in clean, average condition without any missing pages.
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Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing, 15)
Vendeur : Bay State Book Company, North Smithfield, RI, Etats-Unis
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EUR 12,92
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Ajouter au panierEtat : good. The book is in good condition with all pages and cover intact, including the dust jacket if originally issued. The spine may show light wear. Pages may contain some notes or highlighting, and there might be a "From the library of" label. Boxed set packaging, shrink wrap, or included media like CDs may be missing.
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Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing, 15)
Vendeur : Goodwill of Silicon Valley, SAN JOSE, CA, Etats-Unis
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EUR 12,90
EUR 3,43 shipping
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Ajouter au panierEtat : good. Supports Goodwill of Silicon Valley job training programs. The cover and pages are in Good condition! Any other included accessories are also in Good condition showing use. Use can include some highlighting and writing, page and cover creases as well as other types visible wear.
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Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing, 15)
Vendeur : Goodwill of Silicon Valley, SAN JOSE, CA, Etats-Unis
Évaluation du vendeur 4 sur 5 étoiles
EUR 12,91
EUR 3,43 shipping
Ships within Etats-UnisQuantité disponible : 1 disponible(s)
Ajouter au panierEtat : acceptable. Supports Goodwill of Silicon Valley job training programs. The cover and pages are in Acceptable condition! Any other included accessories are also in Acceptable condition showing use. Use can include some highlighting and writing, page and cover creases as well as other types visible wear such as cover tears discoloration, staining, marks, scuffs, etc. All pages intact.
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Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing)
Vendeur : SatelliteBooks, Burlington, VT, Etats-Unis
Évaluation du vendeur 5 sur 5 étoiles
EUR 26,50
EUR 4,72 shipping
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Ajouter au panierHardcover. Etat : As New. Hardcover, no DJ as issued Free of any markings and no writing. Minor shelf-wear. For Additional Information or pictures, Please Inquire.
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1990 HC Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing, 15)
Vendeur : Miki Store, San Jose, CA, Etats-Unis
Évaluation du vendeur 5 sur 5 étoiles
EUR 31,95
EUR 6,06 shipping
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Ajouter au panierhardcover. Etat : Very Good. Pages are crisp and clean, no marking. Cover is verygood. Binding is tight/good.
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Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing, 15)
Vendeur : Toscana Books, AUSTIN, TX, Etats-Unis
Évaluation du vendeur 5 sur 5 étoiles
EUR 43,15
EUR 3,69 shipping
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Ajouter au panierHardcover. Etat : new. Excellent Condition.Excels in customer satisfaction, prompt replies, and quality checks.
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Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing, 15)
Vendeur : BennettBooksLtd, San Diego, NV, Etats-Unis
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EUR 79,72
EUR 5,97 shipping
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Ajouter au panierhardcover. Etat : New. In shrink wrap. Looks like an interesting title!
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Design For At-speed Test, Diagnosis And Measurement (frontiers In Electronic Testing Volume 15) (frontiers In Electronic Testing)
Vendeur : Basi6 International, Irving, TX, Etats-Unis
Évaluation du vendeur 5 sur 5 étoiles
EUR 110,03
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Ajouter au panierEtat : Brand New. New. US edition. Excellent Customer Service.
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Design For At-speed Test, Diagnosis And Measurement (frontiers In Electronic Testing Volume 15) (frontiers In Electronic Testing)
Vendeur : Romtrade Corp., STERLING HEIGHTS, MI, Etats-Unis
Évaluation du vendeur 5 sur 5 étoiles
EUR 110,03
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Ajouter au panierEtat : New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
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Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing, 15)
Vendeur : ALLBOOKS1, Direk, SA, Australie
Évaluation du vendeur 5 sur 5 étoiles
EUR 130,31
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Ajouter au panierBrand new book. Fast ship. Please provide full street address as we are not able to ship to P O box address.
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Design for AT-Speed Test, Diagnosis and Measurement
Vendeur : Books Puddle, New York, NY, Etats-Unis
Évaluation du vendeur 4 sur 5 étoiles
EUR 135,53
EUR 3,43 shipping
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Ajouter au panierEtat : New. pp. 260.
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Design for AT-Speed Test, Diagnosis and Measurement
Vendeur : Majestic Books, Hounslow, Royaume-Uni
Évaluation du vendeur 4 sur 5 étoiles
EUR 143,28
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Ajouter au panierEtat : New. pp. 260 Illus.
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Design for AT-Speed Test, Diagnosis and Measurement
Vendeur : Biblios, Frankfurt am main, HESSE, Allemagne
Évaluation du vendeur 4 sur 5 étoiles
EUR 143,81
EUR 9,95 shipping
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Ajouter au panierEtat : New. pp. 260.
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Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing)
Vendeur : Lucky's Textbooks, Dallas, TX, Etats-Unis
Évaluation du vendeur 5 sur 5 étoiles
EUR 157,92
EUR 3,43 shipping
Ships within Etats-UnisQuantité disponible : Plus de 20 disponibles
Ajouter au panierEtat : New.
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Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing, 15)
Vendeur : Lucky's Textbooks, Dallas, TX, Etats-Unis
Évaluation du vendeur 5 sur 5 étoiles
EUR 158,33
EUR 3,43 shipping
Ships within Etats-UnisQuantité disponible : Plus de 20 disponibles
Ajouter au panierEtat : New.
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Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing)
Vendeur : Ria Christie Collections, Uxbridge, Royaume-Uni
Évaluation du vendeur 5 sur 5 étoiles
EUR 158,28
EUR 13,71 shipping
Ships from Royaume-Uni to Etats-UnisQuantité disponible : Plus de 20 disponibles
Ajouter au panierEtat : New. In.
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Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing, 15)
Vendeur : Ria Christie Collections, Uxbridge, Royaume-Uni
Évaluation du vendeur 5 sur 5 étoiles
EUR 158,28
EUR 13,71 shipping
Ships from Royaume-Uni to Etats-UnisQuantité disponible : Plus de 20 disponibles
Ajouter au panierEtat : New. In.
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Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing)
Vendeur : Mispah books, Redhill, SURRE, Royaume-Uni
Évaluation du vendeur 4 sur 5 étoiles
EUR 179,14
EUR 28,61 shipping
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Ajouter au panierHardcover. Etat : Like New. Like New. book.
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Design for At-Speed Test, Diagnosis and Measurement
Vendeur : Books Puddle, New York, NY, Etats-Unis
Évaluation du vendeur 4 sur 5 étoiles
EUR 205,67
EUR 3,43 shipping
Ships within Etats-UnisQuantité disponible : 4 disponible(s)
Ajouter au panierEtat : New. pp. 260.
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EUR 141,90
EUR 70 shipping
Ships from Allemagne to Etats-UnisQuantité disponible : 5 disponible(s)
Ajouter au panierTaschenbuch. Etat : Neu. Design for AT-Speed Test, Diagnosis and Measurement | Benoit Nadeau-Dostie | Taschenbuch | xvii | Englisch | 2013 | Springer US | EAN 9781475782912 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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Design for AT-Speed Test, Diagnosis and Measurement
Edité par Springer US, Springer New York, 2013
ISBN 10 : 1475782918 ISBN 13 : 9781475782912
Langue: anglais
Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne
Évaluation du vendeur 5 sur 5 étoiles
EUR 164,49
EUR 62,48 shipping
Ships from Allemagne to Etats-UnisQuantité disponible : 1 disponible(s)
Ajouter au panierTaschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a `must read' before any DFT is attempted.
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Design for AT-Speed Test, Diagnosis and Measurement
Edité par Springer US, Springer US, 1999
ISBN 10 : 0792386698 ISBN 13 : 9780792386698
Langue: anglais
Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne
Évaluation du vendeur 5 sur 5 étoiles
EUR 168,73
EUR 63,47 shipping
Ships from Allemagne to Etats-UnisQuantité disponible : 1 disponible(s)
Ajouter au panierBuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a `must read' before any DFT is attempted.
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Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing, 15)
Vendeur : Mispah books, Redhill, SURRE, Royaume-Uni
Évaluation du vendeur 4 sur 5 étoiles
EUR 225,10
EUR 28,61 shipping
Ships from Royaume-Uni to Etats-UnisQuantité disponible : 1 disponible(s)
Ajouter au panierPaperback. Etat : Like New. Like New. book.
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Design for At-Speed Test, Diagnosis and Measurement-
Edité par Kluwer Academic Publishers-, 2000
Vendeur : "Pursuit of Happiness" Books, Oakland, CA, Etats-Unis
Évaluation du vendeur 4 sur 5 étoiles
EUR 91,19
EUR 3,44 shipping
Ships within Etats-UnisQuantité disponible : 1 disponible(s)
Ajouter au panierHardcover. Etat : Good. Hardcover/pub.2000/Gd. condition/238 pages- Design-For-Testability (DFT) is explained and demostrated. (H89755). Book.
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Design for AT-Speed Test, Diagnosis and Measurement
Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne
Évaluation du vendeur 5 sur 5 étoiles
EUR 139,09
EUR 23 shipping
Ships from Allemagne to Etats-UnisQuantité disponible : 2 disponible(s)
Ajouter au panierTaschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a `must read' before any DFT is attempted. 260 pp. Englisch.
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Design for AT-Speed Test, Diagnosis and Measurement
Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne
Évaluation du vendeur 5 sur 5 étoiles
EUR 160,49
EUR 23 shipping
Ships from Allemagne to Etats-UnisQuantité disponible : 2 disponible(s)
Ajouter au panierBuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a `must read' before any DFT is attempted. 260 pp. Englisch.
