Edité par Reading, MA, U.S.A.: Addison-Wesley Educational Publishers, Incorporated, 1985, 1985
ISBN 10 : 0060444444 ISBN 13 : 9780060444440
Langue: anglais
Vendeur : Bingo Used Books, Vancouver, WA, Etats-Unis
EUR 4,48
Autre deviseQuantité disponible : 1 disponible(s)
Ajouter au panierHardcover. Etat : Very Good. Hardcover in very good + condition.
Edité par Reading, MA, U.S.A. : Addison-Wesley Educational Publishers,., 1986
ISBN 10 : 0060444444 ISBN 13 : 9780060444440
Langue: anglais
Vendeur : Virginia Martin, aka bookwitch, Concord, CA, Etats-Unis
EUR 12,55
Autre deviseQuantité disponible : 1 disponible(s)
Ajouter au panierEtat : Very Good. Octavo, hardcover, near fine in white pictorial boards. Clean and unmarked. 414 pp New algorithms are being devised to create tests for logic circuits, and more attention is being given to design for test techniques. In this comprehensive volume the state of the art in digital system design and testing is discussed. (as per 1985). Book.
Edité par Somerset, New Jersey, U.S.A.: John Wiley & Sons Inc, 1986
ISBN 10 : 0471603651 ISBN 13 : 9780471603658
Langue: anglais
Vendeur : Bingo Used Books, Vancouver, WA, Etats-Unis
EUR 13,65
Autre deviseQuantité disponible : 1 disponible(s)
Ajouter au panierHardcover. Etat : Very Good. hardcover in very good + condition.
EUR 16,37
Autre deviseQuantité disponible : 1 disponible(s)
Ajouter au panierHardcover. Etat : Acceptable. Connecting readers with great books since 1972. Used textbooks may not include companion materials such as access codes, etc. May have condition issues including wear and notes/highlighting. We ship orders daily and Customer Service is our top priority!
EUR 23,18
Autre deviseQuantité disponible : 1 disponible(s)
Ajouter au panierEtat : Poor. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In poor condition, suitable as a reading copy. No dust jacket. Water damaged. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,750grams, ISBN:0060444444.
EUR 23,18
Autre deviseQuantité disponible : 1 disponible(s)
Ajouter au panierEtat : Fair. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. Book contains pencil markings. In fair condition, suitable as a study copy. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,750grams, ISBN:0060444444.
Edité par Harper & Row, New York, 1985
ISBN 10 : 0060444444 ISBN 13 : 9780060444440
Vendeur : Between the Covers-Rare Books, Inc. ABAA, Gloucester City, NJ, Etats-Unis
Edition originale
EUR 31,84
Autre deviseQuantité disponible : 1 disponible(s)
Ajouter au panierHardcover. Etat : Fine. First edition. Near fine. Spine darkened just a little.
Edité par Longman Higher Education, 1986
ISBN 10 : 0060444444 ISBN 13 : 9780060444440
Langue: anglais
Vendeur : Ammareal, Morangis, France
Quantité disponible : 1 disponible(s)
Ajouter au panierHardcover. Etat : Moyen. Ancien livre de bibliothèque. Traces d'usure sur la couverture. Edition 1986. Ammareal reverse jusqu'à 15% du prix net de cet article à des organisations caritatives. ENGLISH DESCRIPTION Book Condition: Used, Acceptable. Former library book. Signs of wear on the cover. Edition 1986. Ammareal gives back up to 15% of this item's net price to charity organizations.
EUR 98,04
Autre deviseQuantité disponible : 1 disponible(s)
Ajouter au panierHardcover. Etat : Acceptable. Acceptable. book.
EUR 193,53
Autre deviseQuantité disponible : Plus de 20 disponibles
Ajouter au panierEtat : New.
EUR 192,31
Autre deviseQuantité disponible : Plus de 20 disponibles
Ajouter au panierEtat : New.
EUR 184,88
Autre deviseQuantité disponible : Plus de 20 disponibles
Ajouter au panierEtat : New.
EUR 197,08
Autre deviseQuantité disponible : Plus de 20 disponibles
Ajouter au panierEtat : New. In.
Edité par John Wiley & Sons Inc, New York, 2003
ISBN 10 : 0471439959 ISBN 13 : 9780471439950
Langue: anglais
Vendeur : Grand Eagle Retail, Fairfield, OH, Etats-Unis
EUR 228,86
Autre deviseQuantité disponible : 1 disponible(s)
Ajouter au panierHardcover. Etat : new. Hardcover. Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Yet, as digital systems become more ubiquitous and complex, the challenge of testing them has become more difficult. As one development group designing a RISC stated, "the work required to . . . test a chip of this size approached the amount of effort required to design it." A valued reference for nearly two decades, Digital Logic Testing and Simulation has been significantly revised and updated for designers and test engineers who must meet this challenge. There is no single solution to the testing problem. Organized in an easy-to-follow, sequential format, this Second Edition familiarizes the reader with the many different strategies for testing and their applications, and assesses the strengths and weaknesses of the various approaches. The book reviews the building blocks of a successful testing strategy and guides the reader on choosing the best solution for a particular application. Digital Logic Testing and Simulation, Second Edition covers such key topics as: * Binary Decision Diagrams (BDDs) and cycle-based simulation * Tester architectures/Standard Test Interface Language (STIL) * Practical algorithms written in a Hardware Design Language (HDL) * Fault tolerance * Behavioral Automatic Test Pattern Generation (ATPG) * The development of the Test Design Expert (TDX), the many obstacles encountered and lessons learned in creating this novel testing approach Up-to-date and comprehensive, Digital Logic Testing and Simulation is an important resource for anyone charged with pinpointing faulty products and assuring quality, safety, and profitability. Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
Edité par John Wiley & Sons Inc, New York, 2003
ISBN 10 : 0471439959 ISBN 13 : 9780471439950
Langue: anglais
Vendeur : CitiRetail, Stevenage, Royaume-Uni
EUR 184,89
Autre deviseQuantité disponible : 1 disponible(s)
Ajouter au panierHardcover. Etat : new. Hardcover. Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Yet, as digital systems become more ubiquitous and complex, the challenge of testing them has become more difficult. As one development group designing a RISC stated, "the work required to . . . test a chip of this size approached the amount of effort required to design it." A valued reference for nearly two decades, Digital Logic Testing and Simulation has been significantly revised and updated for designers and test engineers who must meet this challenge. There is no single solution to the testing problem. Organized in an easy-to-follow, sequential format, this Second Edition familiarizes the reader with the many different strategies for testing and their applications, and assesses the strengths and weaknesses of the various approaches. The book reviews the building blocks of a successful testing strategy and guides the reader on choosing the best solution for a particular application. Digital Logic Testing and Simulation, Second Edition covers such key topics as: * Binary Decision Diagrams (BDDs) and cycle-based simulation * Tester architectures/Standard Test Interface Language (STIL) * Practical algorithms written in a Hardware Design Language (HDL) * Fault tolerance * Behavioral Automatic Test Pattern Generation (ATPG) * The development of the Test Design Expert (TDX), the many obstacles encountered and lessons learned in creating this novel testing approach Up-to-date and comprehensive, Digital Logic Testing and Simulation is an important resource for anyone charged with pinpointing faulty products and assuring quality, safety, and profitability. Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.
EUR 288,63
Autre deviseQuantité disponible : 2 disponible(s)
Ajouter au panierHardcover. Etat : Brand New. 2nd edition. 668 pages. 9.50x6.50x1.25 inches. In Stock.
Edité par John Wiley and Sons Ltd, 2003
ISBN 10 : 0471439959 ISBN 13 : 9780471439950
Langue: anglais
Vendeur : Kennys Bookshop and Art Galleries Ltd., Galway, GY, Irlande
EUR 305,43
Autre deviseQuantité disponible : Plus de 20 disponibles
Ajouter au panierEtat : New. Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Num Pages: 696 pages, Illustrations. BIC Classification: TJ. Category: (P) Professional & Vocational. Dimension: 243 x 165 x 43. Weight in Grams: 1130. . 2003. 2nd Edition. Hardcover. . . . .
EUR 363,38
Autre deviseQuantité disponible : Plus de 20 disponibles
Ajouter au panierEtat : As New. Unread book in perfect condition.
EUR 353,73
Autre deviseQuantité disponible : 1 disponible(s)
Ajouter au panierHardcover. Etat : Like New. Like New. book.
Edité par John Wiley and Sons Ltd, 2003
ISBN 10 : 0471439959 ISBN 13 : 9780471439950
Langue: anglais
Vendeur : Kennys Bookstore, Olney, MD, Etats-Unis
EUR 382,65
Autre deviseQuantité disponible : Plus de 20 disponibles
Ajouter au panierEtat : New. Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Num Pages: 696 pages, Illustrations. BIC Classification: TJ. Category: (P) Professional & Vocational. Dimension: 243 x 165 x 43. Weight in Grams: 1130. . 2003. 2nd Edition. Hardcover. . . . . Books ship from the US and Ireland.
EUR 392,12
Autre deviseQuantité disponible : Plus de 20 disponibles
Ajouter au panierEtat : As New. Unread book in perfect condition.
Vendeur : Revaluation Books, Exeter, Royaume-Uni
EUR 266,19
Autre deviseQuantité disponible : 2 disponible(s)
Ajouter au panierHardcover. Etat : Brand New. 2nd edition. 668 pages. 9.50x6.50x1.25 inches. In Stock. This item is printed on demand.