Electromigration electronic device degradation (20 résultats)

Etat : good. A copy that has been read, remains in good condition. All pages are intact, and the cover is intact. The spine and cover show signs of wear. Pages can include notes and highlighting and show signs of wear, and the copy can include "From the library of" labels or previous owner inscriptions. 100% GUARANTEE! Shipped with delivery confirmation, if you're not satisfied with purchase please return item! Ships via media mail.…

hardcover. Etat : Very Good. very clean Wiley hardcover no jacket. no marks. clean text. solid binding. very light wear. ISBN matches listing Fast service with confirmation, no international or priority orders over 4lbs.

HRD. Etat : New. New Book. Shipped from UK. Established seller since 2000.

Etat : new.

Etat : New.

Etat : New.

Etat : New. In English.

Etat : New.

Hardback. Etat : New. Addresses electromigration failure modes in electronics covering both theory and experiments. Reviews silicon and GaAs technologies. Various rate controlling details are summarized including an investigation of temperature dependence. Concludes with a discussion regarding current status and future plans for electromigration resistant advanced metallization systems for VLSI.…

Etat : New. pp. 344.

Etat : New. This study reviews an important reliability issue for both silicon and GaAs technologies. It surveys the status of electromigration physics in microelectronics, and summarizes various rate controlling details. Editor(s): Christou, Aris. Num Pages: 344 pages, black & white illustrations. BIC Classification: PHK; TGPR; TJK; UY. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (XV) Technical / Manuals. Dimension: 236 x 165 x 26. Weight in Grams: 682. . 1993. 1st Edition. Hardcover. . . . . …

Etat : New. pp. 344.

Etat : As New. Unread book in perfect condition.

Hardcover. Etat : Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Etat : As New. Unread book in perfect condition.

Hardback. Etat : New. Addresses electromigration failure modes in electronics covering both theory and experiments. Reviews silicon and GaAs technologies. Various rate controlling details are summarized including an investigation of temperature dependence. Concludes with a discussion regarding current status and future plans for electromigration resistant advanced metallization systems for VLSI.…

Hardcover. Etat : Brand New. 1st edition. 343 pages. 9.75x6.50x0.75 inches. In Stock.

Etat : New. This study reviews an important reliability issue for both silicon and GaAs technologies. It surveys the status of electromigration physics in microelectronics, and summarizes various rate controlling details. Editor(s): Christou, Aris. Num Pages: 344 pages, black & white illustrations. BIC Classification: PHK; TGPR; TJK; UY. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (XV) Technical / Manuals. Dimension: 236 x 165 x 26. Weight in Grams: 682. . 1993. 1st Edition. Hardcover. . . . . Books ship from the US and Ireland. …

Hardcover. Etat : new. Hardcover. Addresses electromigration failure modes in electronics covering both theory and experiments. Reviews silicon and GaAs technologies. Various rate controlling details are summarized including an investigation of temperature dependence. Concludes with a discussion regarding current status and future plans for electromigration resistant advanced metallization systems for VLSI. This study reviews an important reliability issue for both silicon and GaAs technologies. It surveys the status of electromigration physics in microelectronics, and summarizes various rate controlling details. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.…

Hardcover. Etat : Brand New. 1st edition. 343 pages. 9.75x6.50x0.75 inches. In Stock. This item is printed on demand.