Evaluation advanced semiconductor materials (13 résultats)
- Couverture souple
Vendeur : Ria Christie Collections, Uxbridge, Royaume-UniRia Christie Collections
Contacter le vendeurVendeur avec une évaluation de 5 étoilesEtat: Neuf
EUR 61,32
EUR 14,04 expéditionExpédition depuis Royaume-Uni vers Etats-UnisQuantité disponible : Plus de 20 disponibles
Etat : New. In.
- Couverture souple
Vendeur : Chiron Media, Wallingford, Royaume-UniChiron Media
Contacter le vendeurVendeur avec une évaluation de 5 étoilesEtat: Neuf
EUR 57,81
EUR 18,16 expéditionExpédition depuis Royaume-Uni vers Etats-UnisQuantité disponible : 10 disponible(s)
PF. Etat : New.
- Autres images
- Couverture souple
Vendeur : AHA-BUCH GmbH, Einbeck, AllemagneAHA-BUCH GmbH
Contacter le vendeurVendeur avec une évaluation de 5 étoilesEtat: Neuf
EUR 59,97
EUR 63,67 expéditionExpédition depuis Allemagne vers Etats-UnisQuantité disponible : 1 disponible(s)
Taschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - The last few years have ~een rapid improvements in semiconductor growth techniques which have produced an expanding range of high quality heterostructures for new semiconductor devises. As the dimensions of such structures approach the nanometer level,… it becomes increasingly important to characterise materials properties such as composition uniformity, strain, interface sharpness and roughness and the nature of defects, as well as their influence on electrical and optical properties. Much of this information is being obtained by electron microscopy and this is also an area of rapid progress. There have been advances for thin film studies across a wide range of techniques, including, for example, convergent beam electron diffraction, X-ray and electron energy loss microanalysis and high spatial resolution cathodoluminescence as well as by conventional and high resolution methods. Important develop ments have also occurred in the study of surfaces and film growth phenomena by both microscopy and diffraction techniques. With these developments in mind, an application was made to the NATO Science Committee in late summer 1987 to fund an Advanced Research Work shop to review the electron microscopy of advanced semiconductors. This was subsequently accepted for the 1988 programme and became the 'NATO Advanced Research Workshop on the Evaluation of Advanced Semiconductor Materials by Electron Microscopy'. The Workshop took place in the pleasant and intimate surroundings of Wills Hall, Bristol, UK, during the week 11-17 September 1988 and was attended by fifty-five participants from fourteen countries.
Evaluation of Advanced Semiconductor Materials by Electron Microscopy (Nato Science Series B: (203))
- Couverture souple
Vendeur : Mispah books, Redhill, SURRE, Royaume-UniMispah books
Contacter le vendeurVendeur avec une évaluation de 4 étoilesEtat: Occasion - Comme neuf
EUR 112,27
EUR 29,30 expéditionExpédition depuis Royaume-Uni vers Etats-UnisQuantité disponible : 1 disponible(s)
Paperback. Etat : Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
- Autres images
- Couverture rigide
Vendeur : Solr Books, Lincolnwood, IL, Etats-UnisSolr Books
Contacter le vendeurVendeur avec une évaluation de 4 étoilesEtat: Occasion - Satisfaisant
EUR 406,10
EUR 6,99 expéditionExpédition nationale : Etats-UnisQuantité disponible : 1 disponible(s)
Etat : good. This book is in Good condition. There may be some notes and highligting but otherwise the book is in overall good condition.
- Couverture rigide
Vendeur : Buchpark, Trebbin, AllemagneBuchpark
Contacter le vendeurVendeur avec une évaluation de 5 étoilesEtat: Occasion - Très bon
EUR 589,00
EUR 105,00 expéditionExpédition depuis Allemagne vers Etats-UnisQuantité disponible : 2 disponible(s)
Etat : Sehr gut. Zustand: Sehr gut | Seiten: 412 | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar.
- Couverture souple
- impression à la demande
Vendeur : Brook Bookstore On Demand, Napoli, NA, ItalieBrook Bookstore On Demand
Contacter le vendeurVendeur avec une évaluation de 5 étoilesEtat: Neuf
EUR 46,22
EUR 6,80 expéditionExpédition depuis Italie vers Etats-UnisQuantité disponible : Plus de 20 disponibles
Etat : new. Questo è un articolo print on demand.
- Couverture souple
- impression à la demande
Vendeur : Basi6 International, Irving, TX, Etats-UnisBasi6 International
Contacter le vendeurVendeur avec une évaluation de 5 étoilesEtat: Neuf
EUR 61,70
Frais de port gratuitsExpédition nationale : Etats-UnisQuantité disponible : 10 disponible(s)
Etat : Brand New. New. US edition. Print on demand title. Delivery takes 20-25 days. Excellent Customer Service.
- Couverture souple
- impression à la demande
Vendeur : THE SAINT BOOKSTORE, Southport, Royaume-UniTHE SAINT BOOKSTORE
Contacter le vendeurVendeur avec une évaluation de 5 étoilesEtat: Neuf
EUR 69,60
EUR 20,93 expéditionExpédition depuis Royaume-Uni vers Etats-UnisQuantité disponible : Plus de 20 disponibles
Paperback / softback. Etat : New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days.
- Autres images
- Couverture souple
- impression à la demande
Vendeur : moluna, Greven, Allemagnemoluna
Contacter le vendeurVendeur avec une évaluation de 5 étoilesEtat: Neuf
EUR 48,37
EUR 48,99 expéditionExpédition depuis Allemagne vers Etats-UnisQuantité disponible : Plus de 20 disponibles
Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. The last few years have ~een rapid improvements in semiconductor growth techniques which have produced an expanding range of high quality heterostructures for new semiconductor devises. As the dimensions of such structure…s approach the nanometer level, it b.
- Autres images
- Couverture souple
- impression à la demande
Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, AllemagneBuchWeltWeit Ludwig Meier e.K.
Contacter le vendeurVendeur avec une évaluation de 5 étoilesEtat: Neuf
EUR 85,55
EUR 23,00 expéditionExpédition depuis Allemagne vers Etats-UnisQuantité disponible : 2 disponible(s)
Taschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The last few years have ~een rapid improvements in semiconductor growth techniques which have produced an expanding range of high quality heterostructures for new semiconductor devises. As the dimensions of such structures approach the…nanometer level, it becomes increasingly important to characterise materials properties such as composition uniformity, strain, interface sharpness and roughness and the nature of defects, as well as their influence on electrical and optical properties. Much of this information is being obtained by electron microscopy and this is also an area of rapid progress. There have been advances for thin film studies across a wide range of techniques, including, for example, convergent beam electron diffraction, X-ray and electron energy loss microanalysis and high spatial resolution cathodoluminescence as well as by conventional and high resolution methods. Important develop ments have also occurred in the study of surfaces and film growth phenomena by both microscopy and diffraction techniques. With these developments in mind, an application was made to the NATO Science Committee in late summer 1987 to fund an Advanced Research Work shop to review the electron microscopy of advanced semiconductors. This was subsequently accepted for the 1988 programme and became the 'NATO Advanced Research Workshop on the Evaluation of Advanced Semiconductor Materials by Electron Microscopy'. The Workshop took place in the pleasant and intimate surroundings of Wills Hall, Bristol, UK, during the week 11-17 September 1988 and was attended by fifty-five participants from fourteen countries. 428 pp. Englisch.
- Autres images
- Couverture souple
- impression à la demande
Vendeur : buchversandmimpf2000, Emtmannsberg, BAYE, Allemagnebuchversandmimpf2000
Contacter le vendeurVendeur avec une évaluation de 5 étoilesEtat: Neuf
EUR 53,49
EUR 60,00 expéditionExpédition depuis Allemagne vers Etats-UnisQuantité disponible : 1 disponible(s)
Taschenbuch. Etat : Neu. This item is printed on demand - Print on Demand Titel. Neuware -The last few years have ~een rapid improvements in semiconductor growth techniques which have produced an expanding range of high quality heterostructures for new semiconductor devises. As the dimensions of such structures approach the nano…meter level, it becomes increasingly important to characterise materials properties such as composition uniformity, strain, interface sharpness and roughness and the nature of defects, as well as their influence on electrical and optical properties. Much of this information is being obtained by electron microscopy and this is also an area of rapid progress. There have been advances for thin film studies across a wide range of techniques, including, for example, convergent beam electron diffraction, X-ray and electron energy loss microanalysis and high spatial resolution cathodoluminescence as well as by conventional and high resolution methods. Important develop ments have also occurred in the study of surfaces and film growth phenomena by both microscopy and diffraction techniques. With these developments in mind, an application was made to the NATO Science Committee in late summer 1987 to fund an Advanced Research Work shop to review the electron microscopy of advanced semiconductors. This was subsequently accepted for the 1988 programme and became the 'NATO Advanced Research Workshop on the Evaluation of Advanced Semiconductor Materials by Electron Microscopy'. The Workshop took place in the pleasant and intimate surroundings of Wills Hall, Bristol, UK, during the week 11-17 September 1988 and was attended by fifty-five participants from fourteen countries.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 428 pp. Englisch.
- Autres images
- Couverture souple
- impression à la demande
Vendeur : preigu, Osnabrück, Allemagnepreigu
Contacter le vendeurVendeur avec une évaluation de 5 étoilesEtat: Neuf
EUR 50,25
EUR 70,00 expéditionExpédition depuis Allemagne vers Etats-UnisQuantité disponible : 5 disponible(s)
Taschenbuch. Etat : Neu. Evaluation of Advanced Semiconductor Materials by Electron Microscopy | David Cherns | Taschenbuch | 412 S. | Englisch | 2011 | Springer US | EAN 9781461278504 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbiet…er: preigu Print on Demand.
