Vendeur : Anybook.com, Lincoln, Royaume-Uni
EUR 30,76
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Ajouter au panierEtat : Poor. Volume 9. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In poor condition, suitable as a reading copy. No dust jacket. Library sticker on front cover. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,800grams, ISBN:3540158332.
EUR 79,64
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Ajouter au panierEtat : New. pp. xviii + 349.
Vendeur : Revaluation Books, Exeter, Royaume-Uni
EUR 84,63
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Ajouter au panierPaperback. Etat : Brand New. 1986 edition. 349 pages. 9.50x6.10x0.90 inches. In Stock.
Langue: anglais
Edité par Springer Berlin Heidelberg, 2014
ISBN 10 : 3642500331 ISBN 13 : 9783642500336
Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne
EUR 53,49
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Ajouter au panierTaschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - The phenomenon of Extended X-Ray Absorption Fine Structure (EXAFS) has been known for some time and was first treated theoretically by Kronig in the 1930s. Recent developments, initiated by Sayers, Stern, and Lytle in the early 1970s, have led to the recognition of the structural content of this technique. At the same time, the availability of synchrotron radiation has greatly improved both the acquisition and the quality of the EXAFS data over those obtainable from conventional X-ray sources. Such developments have established EXAFS as a powerful tool for structure studies. EXAFS has been successfully applied to a wide range of significant scientific and technological systems in many diverse fields such as inorganic chemistry, biochemistry, catalysis, material sciences, etc. It is extremely useful for systems where single-crystal diffraction techniques are not readily applicable (e.g., gas, liquid, solution, amorphous and polycrystalline solids, surfaces, polymer, etc.). Despite the fact that the EXAFS technique and applications have matured tremendously over the past decade or so, no introductory textbook exists. EXAFS: Basic Principles and Data Analysis represents my modest attempt to fill such a gap. In this book, I aim to introduce the subject matter to the novice and to help alleviate the confusion in EXAFS data analysis, which, although becoming more and more routine, is still a rather tricky endeavor and may, at times, discourage the beginners.
EUR 49,05
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Ajouter au panierTaschenbuch. Etat : Neu. EXAFS: Basic Principles and Data Analysis | Boon K. Teo | Taschenbuch | xviii | Englisch | 2014 | Springer-Verlag GmbH | EAN 9783642500336 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
Vendeur : Salish Sea Books, Bellingham, WA, Etats-Unis
EUR 119,46
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Ajouter au panierHardcover. Etat : Good. 0387158332 Good+; Hardcover; Withdrawn library copy with the standard library markings; Light wear to the covers; Library stamps to the endpapers; Text pages are clean & unmarked; Good binding; This book will be stored and delivered in a sturdy cardboard box with foam padding; Medium-Large Format (Quatro, 9.75" - 10.75" tall); Orange cloth covers with title in black lettering; 1986, Springer-Verlag Publishing; 349 pages; "Exafs: Basic Principles and Data Analysis (Inorganic Chemistry Concepts)," by Boon K. Teo.
Vendeur : Mispah books, Redhill, SURRE, Royaume-Uni
EUR 100,04
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Ajouter au panierPaperback. Etat : Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
Langue: anglais
Edité par Springer Berlin Heidelberg, Springer Apr 2014, 2014
ISBN 10 : 3642500331 ISBN 13 : 9783642500336
Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne
EUR 53,49
Quantité disponible : 2 disponible(s)
Ajouter au panierTaschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The phenomenon of Extended X-Ray Absorption Fine Structure (EXAFS) has been known for some time and was first treated theoretically by Kronig in the 1930s. Recent developments, initiated by Sayers, Stern, and Lytle in the early 1970s, have led to the recognition of the structural content of this technique. At the same time, the availability of synchrotron radiation has greatly improved both the acquisition and the quality of the EXAFS data over those obtainable from conventional X-ray sources. Such developments have established EXAFS as a powerful tool for structure studies. EXAFS has been successfully applied to a wide range of significant scientific and technological systems in many diverse fields such as inorganic chemistry, biochemistry, catalysis, material sciences, etc. It is extremely useful for systems where single-crystal diffraction techniques are not readily applicable (e.g., gas, liquid, solution, amorphous and polycrystalline solids, surfaces, polymer, etc.). Despite the fact that the EXAFS technique and applications have matured tremendously over the past decade or so, no introductory textbook exists. EXAFS: Basic Principles and Data Analysis represents my modest attempt to fill such a gap. In this book, I aim to introduce the subject matter to the novice and to help alleviate the confusion in EXAFS data analysis, which, although becoming more and more routine, is still a rather tricky endeavor and may, at times, discourage the beginners. 368 pp. Englisch.
Vendeur : Majestic Books, Hounslow, Royaume-Uni
EUR 78,16
Quantité disponible : 4 disponible(s)
Ajouter au panierEtat : New. Print on Demand pp. xviii + 349.
Vendeur : Biblios, Frankfurt am main, HESSE, Allemagne
EUR 78,77
Quantité disponible : 4 disponible(s)
Ajouter au panierEtat : New. PRINT ON DEMAND pp. xviii + 349.
Langue: anglais
Edité par Springer Berlin Heidelberg, Springer Berlin Heidelberg Apr 2014, 2014
ISBN 10 : 3642500331 ISBN 13 : 9783642500336
Vendeur : buchversandmimpf2000, Emtmannsberg, BAYE, Allemagne
EUR 53,49
Quantité disponible : 1 disponible(s)
Ajouter au panierTaschenbuch. Etat : Neu. This item is printed on demand - Print on Demand Titel. Neuware -The phenomenon of Extended X-Ray Absorption Fine Structure (EXAFS) has been known for some time and was first treated theoretically by Kronig in the 1930s. Recent developments, initiated by Sayers, Stern, and Lytle in the early 1970s, have led to the recognition of the structural content of this technique. At the same time, the availability of synchrotron radiation has greatly improved both the acquisition and the quality of the EXAFS data over those obtainable from conventional X-ray sources. Such developments have established EXAFS as a powerful tool for structure studies. EXAFS has been successfully applied to a wide range of significant scientific and technological systems in many diverse fields such as inorganic chemistry, biochemistry, catalysis, material sciences, etc. It is extremely useful for systems where single-crystal diffraction techniques are not readily applicable (e.g., gas, liquid, solution, amorphous and polycrystalline solids, surfaces, polymer, etc.). Despite the fact that the EXAFS technique and applications have matured tremendously over the past decade or so, no introductory textbook exists. EXAFS: Basic Principles and Data Analysis represents my modest attempt to fill such a gap. In this book, I aim to introduce the subject matter to the novice and to help alleviate the confusion in EXAFS data analysis, which, although becoming more and more routine, is still a rather tricky endeavor and may, at times, discourage the beginners.Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 368 pp. Englisch.