General principles applications clean (17 résultats)

Etat : Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has soft covers. In good all round condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,500grams, ISBN:9783540584155.

Etat : Fair. Volume 20. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. Clean from markings. In fair condition, suitable as a study copy. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,600grams, ISBN:0387543082.…

Etat : New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

Etat : Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.

Etat : Fair. This is an ex-library book and may have the usual library/used-book markings inside.This book has soft covers. In fair condition, suitable as a study copy. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,550grams, ISBN:9783540584155. …

Etat : As New. Unread book in perfect condition.

Softcover. Etat : Befriedigend. 2. Auflage. Scanning Tunneling Microscopy I: General Principles and Applications to Clean and Adsorbate-Covered Surfaces. With 172 Figures. 3540584153. 279 S. UND Scanning Tunneling Microscopy II: Further Applications and Related Scanning Techniques (Springer Series in Surface Sciences)With 167 Figures. 3540585893. 349 S. Exlibrarybook with signatures, codes and stamps. Good condition. Inside o.k. 1072 In englischer Sprache. 0 pages. 23x15cm.…

PF. Etat : New.

Etat : New.

Etat : New. In English.

Softcover. Etat : Gut. 2nd ed. 280 S. Ehem. Bibliotheksexemplar mit Signatur und Stempel. GUTER Zustand, ein paar Gebrauchsspuren. Ex-library in GOOD condition with library-signature and stamp(s). Some traces of use. R-16265 9783540584155 Sprache: Englisch Gewicht in Gramm: 550.

Paperback. Etat : Brand New. 2nd edition. 292 pages. 9.39x6.15x0.62 inches. In Stock.

Taschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - Since the first edition of 'Scanning 'funneling Microscopy I' has been pub lished, considerable progress has been made in the application of STM to the various classes of materials treated in this volume, most notably in the field of adsorbates and molecular systems. An update of the most recent develop ments will be given in an additional Chapter 9. The editors would like to thank all the contributors who have supplied up dating material, and those who have provided us with suggestions for further improvements. We also thank Springer-Verlag for the decision to publish this second edition in paperback, thereby making this book affordable for an even wider circle of readers. Hamburg, July 1994 R. Wiesendanger Preface to the First Edition Since its invention in 1981 by G. Binnig, H. Rohrer and coworkers at the IBM Zurich Research Laboratory, scanning tunneling microscopy (STM) has devel oped into an invaluable surface analytical technique allowing the investigation of real-space surface structures at the atomic level. The conceptual simplicity of the STM technique is startling: bringing a sharp needle to within a few Angstroms of the surface of a conducting sample and using the tunneling cur rent, which flows on application of a bias voltage, to sense the atomic and elec tronic surface structure with atomic resolution! Prior to 1981 considerable scepticism existed as to the practicability of this approach.…

Etat : Sehr gut. Zustand: Sehr gut | Seiten: 296 | Sprache: Englisch | Produktart: Bücher | Since the first edition of "Scanning 'funneling Microscopy I" has been pub­ lished, considerable progress has been made in the application of STM to the various classes of materials treated in this volume, most notably in the field of adsorbates and molecular systems. An update of the most recent develop­ ments will be given in an additional Chapter 9. The editors would like to thank all the contributors who have supplied up­ dating material, and those who have provided us with suggestions for further improvements. We also thank Springer-Verlag for the decision to publish this second edition in paperback, thereby making this book affordable for an even wider circle of readers. Hamburg, July 1994 R. Wiesendanger Preface to the First Edition Since its invention in 1981 by G. Binnig, H. Rohrer and coworkers at the IBM Zurich Research Laboratory, scanning tunneling microscopy (STM) has devel­ oped into an invaluable surface analytical technique allowing the investigation of real-space surface structures at the atomic level. The conceptual simplicity of the STM technique is startling: bringing a sharp needle to within a few Angstroms of the surface of a conducting sample and using the tunneling cur­ rent, which flows on application of a bias voltage, to sense the atomic and elec­ tronic surface structure with atomic resolution! Prior to 1981 considerable scepticism existed as to the practicability of this approach. …

Etat : Sehr gut. Zustand: Sehr gut | Seiten: 296 | Sprache: Englisch | Produktart: Bücher | Since the first edition of "Scanning 'funneling Microscopy I" has been pub­ lished, considerable progress has been made in the application of STM to the various classes of materials treated in this volume, most notably in the field of adsorbates and molecular systems. An update of the most recent develop­ ments will be given in an additional Chapter 9. The editors would like to thank all the contributors who have supplied up­ dating material, and those who have provided us with suggestions for further improvements. We also thank Springer-Verlag for the decision to publish this second edition in paperback, thereby making this book affordable for an even wider circle of readers. Hamburg, July 1994 R. Wiesendanger Preface to the First Edition Since its invention in 1981 by G. Binnig, H. Rohrer and coworkers at the IBM Zurich Research Laboratory, scanning tunneling microscopy (STM) has devel­ oped into an invaluable surface analytical technique allowing the investigation of real-space surface structures at the atomic level. The conceptual simplicity of the STM technique is startling: bringing a sharp needle to within a few Angstroms of the surface of a conducting sample and using the tunneling cur­ rent, which flows on application of a bias voltage, to sense the atomic and elec­ tronic surface structure with atomic resolution! Prior to 1981 considerable scepticism existed as to the practicability of this approach. …

Hardcover. Etat : Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Etat : Gut. Zustand: Gut | Seiten: 296 | Sprache: Englisch | Produktart: Bücher | Since the first edition of "Scanning 'funneling Microscopy I" has been pub­ lished, considerable progress has been made in the application of STM to the various classes of materials treated in this volume, most notably in the field of adsorbates and molecular systems. An update of the most recent develop­ ments will be given in an additional Chapter 9. The editors would like to thank all the contributors who have supplied up­ dating material, and those who have provided us with suggestions for further improvements. We also thank Springer-Verlag for the decision to publish this second edition in paperback, thereby making this book affordable for an even wider circle of readers. Hamburg, July 1994 R. Wiesendanger Preface to the First Edition Since its invention in 1981 by G. Binnig, H. Rohrer and coworkers at the IBM Zurich Research Laboratory, scanning tunneling microscopy (STM) has devel­ oped into an invaluable surface analytical technique allowing the investigation of real-space surface structures at the atomic level. The conceptual simplicity of the STM technique is startling: bringing a sharp needle to within a few Angstroms of the surface of a conducting sample and using the tunneling cur­ rent, which flows on application of a bias voltage, to sense the atomic and elec­ tronic surface structure with atomic resolution! Prior to 1981 considerable scepticism existed as to the practicability of this approach.…