introduction surface analysis xps (21 résultats)

Etat : Very Good. 2Rev Ed. Former library copy. Pages intact with possible writing/highlighting. Binding strong with minor wear. Dust jackets/supplements may not be included. Includes library markings. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.

Paperback. Etat : Gut. 1st ed. 212 S.; Ill. Ex.-Libr., Good condition. Sprache: Englisch Gewicht in Gramm: 505.

Etat : Fair. This is an ex-library book and may have the usual library/used-book markings inside.This book has soft covers. In fair condition, suitable as a study copy. Library sticker on front cover. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,500grams, ISBN:9780470847138.

Etat : As New. Unread book in perfect condition.

HRD. Etat : New. New Book. Shipped from UK. Established seller since 2000.

Etat : New.

Etat : new.

Etat : New. In.

Etat : New.

Etat : As New. Unread book in perfect condition.

Etat : New.

Etat : New. 2019. 2nd. Hardcover. . . . . .

Etat : New.

Etat : New. 2019. 2nd. Hardcover. . . . . . Books ship from the US and Ireland.

Etat : New. John F. Watts FREng is Professor of Materials Science in the Department of Mechanical Engineering Sciences at the University of Surrey. He currently leads a Research Group applying surface analysis methods to investigations in materials science and is Edito.

Buch. Etat : Neu. Neuware - Provides a concise yet comprehensive introduction to XPS and AES techniques in surface analysisThis accessible second edition of the bestselling book, An Introduction to Surface Analysis by XPS and AES, 2nd Edition explores the basic principles and applications of X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) techniques. It starts with an examination of the basic concepts of electron spectroscopy and electron spectrometer design, followed by a qualitative and quantitative interpretation of the electron spectrum.Chapters examine recent innovations in instrument design and key applications in metallurgy, biomaterials, and electronics. Practical and concise, it includes compositional depth profiling; multi-technique analysis; and everything about samples--including their handling, preparation, stability, and more. Topics discussed in more depth include peak fitting, energy loss background analysis, multi-technique analysis, and multi-technique profiling. The book finishes with chapters on applications of electron spectroscopy in materials science and the comparison of XPS and AES with other analytical techniques.\* Extensively revised and updated with new material on NAPXPS, twin anode monochromators, gas cluster ion sources, valence band spectra, hydrogen detection, and quantification\* Explores key spectroscopic techniques in surface analysis\* Provides descriptions of latest instruments and techniques\* Includes a detailed glossary of key surface analysis terms\* Features an extensive bibliography of key references and additional reading\* Uses a non-theoretical style to appeal to industrial surface analysis sectorsAn Introduction to Surface Analysis by XPS and AES, 2nd Edition is an excellent introductory text for undergraduates, first-year postgraduates, and industrial users of XPS and AES.

Hardcover. Etat : Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

paperback. Etat : New. Paperback. Pub Date: 2008 Pages: 144 Language: Chinese in Publisher: East China University of Science and Technology Press. the book tells the story of modern electron spectroscopy in monochromated XPS small area. XPS (SAXPS). imaging XPS. XPS depth profiling. field emission features such as AES / SAM analysis technology. as well as in the metallurgical. corrosion applications in the field of ceramics. catalyst. microelectronics. semiconductor materials. adhesives. coatings. polymer materials.

Hardcover. Etat : new. Hardcover. Provides a concise yet comprehensive introduction to XPS and AES techniques in surface analysis This accessible second edition of the bestselling book, An Introduction to Surface Analysis by XPS and AES, 2nd Edition explores the basic principles and applications of X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) techniques. It starts with an examination of the basic concepts of electron spectroscopy and electron spectrometer design, followed by a qualitative and quantitative interpretation of the electron spectrum. Chapters examine recent innovations in instrument design and key applications in metallurgy, biomaterials, and electronics. Practical and concise, it includes compositional depth profiling; multi-technique analysis; and everything about samplesincluding their handling, preparation, stability, and more. Topics discussed in more depth include peak fitting, energy loss background analysis, multi-technique analysis, and multi-technique profiling. The book finishes with chapters on applications of electron spectroscopy in materials science and the comparison of XPS and AES with other analytical techniques. Extensively revised and updated with new material on NAPXPS, twin anode monochromators, gas cluster ion sources, valence band spectra, hydrogen detection, and quantificationExplores key spectroscopic techniques in surface analysisProvides descriptions of latest instruments and techniquesIncludes a detailed glossary of key surface analysis termsFeatures an extensive bibliography of key references and additional readingUses a non-theoretical style to appeal to industrial surface analysis sectors An Introduction to Surface Analysis by XPS and AES, 2nd Edition is an excellent introductory text for undergraduates, first-year postgraduates, and industrial users of XPS and AES. This item is printed on demand. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.

Hardcover. Etat : Brand New. 2nd edition. 288 pages. 9.00x6.00x0.75 inches. In Stock. This item is printed on demand.

Hardcover. Etat : new. Hardcover. Provides a concise yet comprehensive introduction to XPS and AES techniques in surface analysis This accessible second edition of the bestselling book, An Introduction to Surface Analysis by XPS and AES, 2nd Edition explores the basic principles and applications of X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) techniques. It starts with an examination of the basic concepts of electron spectroscopy and electron spectrometer design, followed by a qualitative and quantitative interpretation of the electron spectrum. Chapters examine recent innovations in instrument design and key applications in metallurgy, biomaterials, and electronics. Practical and concise, it includes compositional depth profiling; multi-technique analysis; and everything about samplesincluding their handling, preparation, stability, and more. Topics discussed in more depth include peak fitting, energy loss background analysis, multi-technique analysis, and multi-technique profiling. The book finishes with chapters on applications of electron spectroscopy in materials science and the comparison of XPS and AES with other analytical techniques. Extensively revised and updated with new material on NAPXPS, twin anode monochromators, gas cluster ion sources, valence band spectra, hydrogen detection, and quantificationExplores key spectroscopic techniques in surface analysisProvides descriptions of latest instruments and techniquesIncludes a detailed glossary of key surface analysis termsFeatures an extensive bibliography of key references and additional readingUses a non-theoretical style to appeal to industrial surface analysis sectors An Introduction to Surface Analysis by XPS and AES, 2nd Edition is an excellent introductory text for undergraduates, first-year postgraduates, and industrial users of XPS and AES. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.