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Vendeur : GreatBookPricesUK, Woodford Green, Royaume-Uni
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Langue: anglais
Edité par Elsevier Science Publishing Co Inc, US, 2021
ISBN 10 : 0128246073 ISBN 13 : 9780128246078
Vendeur : Rarewaves.com USA, London, LONDO, Royaume-Uni
EUR 289,44
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Ajouter au panierHardback. Etat : New. Quantitative Atomic-Resolution Electron Microscopy, Volume 217, the latest release in the Advances in Imaging and Electron Physics series merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods. Chapters in this release include Statistical parameter estimation theory, Efficient fitting algorithm, Statistics-based atom counting , Atom column detection, Optimal experiment design for nanoparticle atom-counting from ADF STEM images, and more.
Langue: anglais
Edité par Elsevier Science Publishing Co Inc, US, 2021
ISBN 10 : 0128246073 ISBN 13 : 9780128246078
Vendeur : Rarewaves.com UK, London, Royaume-Uni
EUR 273,28
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Ajouter au panierHardback. Etat : New. Quantitative Atomic-Resolution Electron Microscopy, Volume 217, the latest release in the Advances in Imaging and Electron Physics series merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods. Chapters in this release include Statistical parameter estimation theory, Efficient fitting algorithm, Statistics-based atom counting , Atom column detection, Optimal experiment design for nanoparticle atom-counting from ADF STEM images, and more.
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Ajouter au panierEtat : New. 1st edition NO-PA16APR2015-KAP.
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Vendeur : Ria Christie Collections, Uxbridge, Royaume-Uni
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Ajouter au panierEtat : New. Contains contributions from leading authorities on the subject matter Informs and updates on the latest developments in the field of imaging and electron physics Provides practitioners interested in microscopy, optics, image proce.
Vendeur : Brook Bookstore On Demand, Napoli, NA, Italie
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Ajouter au panierEtat : new. Questo è un articolo print on demand.
Langue: anglais
Edité par Elsevier Science & Technology, Academic Press, 2021
ISBN 10 : 0128246073 ISBN 13 : 9780128246078
Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne
EUR 175
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Ajouter au panierBuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Quantitative Atomic-Resolution Electron Microscopy, Volume 217, the latest release in the Advances in Imaging and Electron Physics series merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods. Chapters in this release include Statistical parameter estimation theory, Efficient fitting algorithm, Statistics-based atom counting , Atom column detection, Optimal experiment design for nanoparticle atom-counting from ADF STEM images, and more. Englisch.
Vendeur : Revaluation Books, Exeter, Royaume-Uni
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Ajouter au panierHardcover. Etat : Brand New. 232 pages. 9.00x6.00x0.79 inches. In Stock. This item is printed on demand.
Langue: anglais
Edité par Elsevier Science & Technology, Academic Press, 2021
ISBN 10 : 0128246073 ISBN 13 : 9780128246078
Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne
EUR 192,72
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Ajouter au panierBuch. Etat : Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Quantitative Atomic-Resolution Electron Microscopy, Volume 217, the latest release in the Advances in Imaging and Electron Physics series merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods. Chapters in this release include Statistical parameter estimation theory, Efficient fitting algorithm, Statistics-based atom counting , Atom column detection, Optimal experiment design for nanoparticle atom-counting from ADF STEM images, and more.