Statistical analysis spatial pattern par bartlett (18 résultats)

Etat : Good. Pages intact with minimal writing/highlighting. The binding may be loose and creased. Dust jackets/supplements are not included. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.

Etat : Good. Light wear to boards. Content is clean and bright. Good DJ. Small name to endpaper.

Hardcover. Etat : Very Good. No Jacket. May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less.

Etat : good. A copy that has been read, remains in good condition. All pages are intact, and the cover is intact. The spine and cover show signs of wear. Pages can include notes and highlighting and show signs of wear, and the copy can include "From the library of" labels or previous owner inscriptions. 100% GUARANTEE! Shipped with delivery confirmation, if you're not satisfied with purchase please return item! Ships via media mail.…

Hardcover. Etat : Good. No Dust Jacket. First Edition. Green cover with silver gilt lettering to spine has 4 cm tear along the edge of spine. Contents in very good clean condition. Library plate on front inside cover. Library stamp on prelims, some pages (with no obstruction of text), back inside cover and top of page block. Illustrated with diagrams and tables. Ex-Library.…

Hardcover. Etat : Gut. Ex-library with stamp and library-signature. GOOD condition, some traces of use. Ancien Exemplaire de bibliothèque avec signature et cachet. BON état, quelques traces d'usure. Ehem. Bibliotheksexemplar mit Signatur und Stempel. GUTER Zustand, ein paar Gebrauchsspuren. 62 BAR 9780470054673 Sprache: Englisch Gewicht in Gramm: 250.…

Etat : New.

Etat : As New. Unread book in perfect condition.

Etat : New. pp. 106.

Taschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - In a contribution (Bartlett, 1971 a) to the Symposium on Statistical Ecology at Yale in 1969, I noted in my introductory remarks that that paper was not intended to be in any way a review of statistical techniques for analysing spatial patterns. My contribution to a conference at Sheffield in 1973 aimed, at least in part, to supply such a review and forms the basis of this monograph; but in these prefatory remarks I must still make clear what I decided to discuss, and what I have omitted. Broadly speaking, the coverage is that included in seminars and lectures I have given on this theme since 1969. We may divide problems of spatial pattern (in contrast with complete random chaos) into (i) detecting departures from randomness, Oi) analysing such departures when detected, for example, in relation to some stochastic model and (iii) special problems which require separate consideration; for example, sophisticated problems of pattern recognition in specific fields, such as the computer reading of handwriting or recognition of chromosomes.…

Taschenbuch. Etat : Neu. The Statistical Analysis of Spatial Pattern | M. S. Bartlett | Taschenbuch | x | Englisch | 2013 | Springer Netherland | EAN 9789400957572 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.…

Primera edición. 4to. 90pp. Encuadernación en tela editorial con sobrecubierta. Excelente estado. First edition. In original cloth with dustjacket. Excellent copy.

PF. Etat : New. This item is printed on demand. Brand new book, sourced directly from publisher. Dispatch time is 6-7 days from our warehouse. Book will be sent in robust, secure packaging to ensure it reaches you securely.

Etat : New. Print on Demand pp. 106 22:B&W 5.5 x 8.5 in or 216 x 140 mm (Demy 8vo) Perfect Bound on White w/Gloss Lam.

Etat : New. PRINT ON DEMAND pp. 106.

Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. In a contribution (Bartlett, 1971 a) to the Symposium on Statistical Ecology at Yale in 1969, I noted in my introductory remarks that that paper was not intended to be in any way a review of statistical techniques for analysing spatial patterns. My contribu.…

Taschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -In a contribution (Bartlett, 1971 a) to the Symposium on Statistical Ecology at Yale in 1969, I noted in my introductory remarks that that paper was not intended to be in any way a review of statistical techniques for analysing spatial patterns. My contribution to a conference at Sheffield in 1973 aimed, at least in part, to supply such a review and forms the basis of this monograph; but in these prefatory remarks I must still make clear what I decided to discuss, and what I have omitted. Broadly speaking, the coverage is that included in seminars and lectures I have given on this theme since 1969. We may divide problems of spatial pattern (in contrast with complete random chaos) into (i) detecting departures from randomness, Oi) analysing such departures when detected, for example, in relation to some stochastic model and (iii) special problems which require separate consideration; for example, sophisticated problems of pattern recognition in specific fields, such as the computer reading of handwriting or recognition of chromosomes. 104 pp. Englisch.…

Taschenbuch. Etat : Neu. This item is printed on demand - Print on Demand Titel. Neuware -In a contribution (Bartlett, 1971 a) to the Symposium on Statistical Ecology at Yale in 1969, I noted in my introductory remarks that that paper was not intended to be in any way a review of statistical techniques for analysing spatial patterns. My contribution to a conference at Sheffield in 1973 aimed, at least in part, to supply such a review and forms the basis of this monograph; but in these prefatory remarks I must still make clear what I decided to discuss, and what I have omitted. Broadly speaking, the coverage is that included in seminars and lectures I have given on this theme since 1969. We may divide problems of spatial pattern (in contrast with complete random chaos) into (i) detecting departures from randomness, Oi) analysing such departures when detected, for example, in relation to some stochastic model and (iii) special problems which require separate consideration; for example, sophisticated problems of pattern recognition in specific fields, such as the computer reading of handwriting or recognition of chromosomes.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 104 pp. Englisch.…