Physical Principles of Electron Microscopy: An Introduction to Tem, Sem, and Aem - Couverture rigide

Egerton, R.F.

Couverture rigide

ISBN 10 : 0387258000 ISBN 13 : 9780387258003

Editeur : Springer-Verlag New York Inc., 2005

Synopsis

Scanning and stationary-beam electron microscopes have become indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book provides an introduction to the theory and current practice of electron microscopy, aimed primarily at undergraduates who need to learn how the basic principles of physics are applied in an important area of science and technology that has contributed greatly to our knowledge of life processes and "inner space." Less technical but broader in scope than other microscopy textbooks, Physical Principles of Electron Microscopy is appropriate for undergraduates and technologists with limited mathematical training. However, it will be equally valuable for for graduate students, university teachers and researchers who need a concise text that deals with the basic principles of microscopy.

A propos du livre

Présentation de l'éditeur

This book introduces current theory and practice of electron microscopy, primarily for undergraduates, as well as for technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.

Détails de l'édition

• Éditeur: Springer-Verlag New York Inc.
• Date d'édition: 2005
• Langue: anglais
• ISBN 10: 0387258000
• ISBN 13: 9780387258003
• Reliure: Relié
• Numéro d'édition: 1
• Nombre de pages: 214
• Coordonnées du fabricant: non disponible
• Personne responsable: CMN Printpool Inh. Mathis Neumann; https://www.also.com/ec/cms5/en_6000/6000/index.jsp; ; Friedrich-Karl-Str. 9; Hamburg; Allemagne